Hu et al., 2022 - Google Patents
LE–MSFE–DDNet: a defect detection network based on low-light enhancement and multi-scale feature extractionHu et al., 2022
- Document ID
- 2001678490494275447
- Author
- Hu W
- Wang T
- Wang Y
- Chen Z
- Huang G
- Publication year
- Publication venue
- The Visual Computer
External Links
Snippet
Surface defect detection of industrial products has become a promising area of research. Among the existing defect detection algorithms, most of the CNN-based methods can achieve the task of defect detection under ideal experimental conditions. However, the …
- 238000001514 detection method 0 title abstract description 86
Classifications
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- G06K9/4604—Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections
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