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Hu et al., 2022 - Google Patents

LE–MSFE–DDNet: a defect detection network based on low-light enhancement and multi-scale feature extraction

Hu et al., 2022

Document ID
2001678490494275447
Author
Hu W
Wang T
Wang Y
Chen Z
Huang G
Publication year
Publication venue
The Visual Computer

External Links

Snippet

Surface defect detection of industrial products has become a promising area of research. Among the existing defect detection algorithms, most of the CNN-based methods can achieve the task of defect detection under ideal experimental conditions. However, the …
Continue reading at link.springer.com (other versions)

Classifications

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    • G06K9/4604Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections
    • G06K9/4609Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections by matching or filtering
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    • GPHYSICS
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