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Saporoschenko, 1958 - Google Patents

Ions in nitrogen

Saporoschenko, 1958

Document ID
1930485905960483806
Author
Saporoschenko M
Publication year
Publication venue
Physical review

External Links

Snippet

Abstract N+, N 2+, N 3+, and N 4+ ions have been identified in nitrogen gas by use of a mass spectrometer operated with the ion source in the pressure range from 10− 3 mm Hg to 0.6 mm Hg. Appearance potentials occur at 15.5±0.2 ev for N 2+, at 15.8±0.3 ev for N 4+, at …
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    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
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    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
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    • H01J49/426—Methods for controlling ions
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    • H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
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    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
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    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
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