Nothing Special   »   [go: up one dir, main page]

Roelli et al., 2025 - Google Patents

In-operando control of sum-frequency generation in tip-enhanced nanocavities

Roelli et al., 2025

View PDF
Document ID
18177988321026754214
Author
Roelli P
Pascual I
Niehues I
Aizpurua J
Hillenbrand R
Publication year
Publication venue
arXiv preprint arXiv:2501.01784

External Links

Snippet

Sum-frequency generation (SFG) is a second-order nonlinear process widely used for characterizing surfaces and interfaces with monolayer sensitivity. Recently, optical field enhancement in plasmonic nanocavities has enabled SFG with continuous wave (CW) …
Continue reading at arxiv.org (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N2021/653—Coherent methods [CARS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colour
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry; Fluorescence spectrometry

Similar Documents

Publication Publication Date Title
Jones et al. Raman techniques: fundamentals and frontiers
van Dijk et al. Absorption and scattering microscopy of single metal nanoparticles
Mauser et al. Tip-enhanced near-field optical microscopy
Hartschuh et al. Tip-enhanced optical spectroscopy
Wickramasinghe et al. Billion-fold increase in tip-enhanced Raman signal
US6809814B2 (en) System and method for epi-detected coherent anti-stokes raman scattering microscopy
US9046492B1 (en) Stimulated raman nanospectroscopy
Kneipp et al. Probing plasmonic nanostructures by photons and electrons
Horneber et al. Nonlinear optical imaging of single plasmonic nanoparticles with 30 nm resolution
El-Khoury et al. Visualizing surface plasmons with photons, photoelectrons, and electrons
Ikemoto et al. Development of scattering near-field optical microspectroscopy apparatus using an infrared synchrotron radiation source
Prylepa et al. Material characterisation with methods of nonlinear optics
Schaller et al. Near-field infrared sum-frequency generation imaging of chemical vapor deposited zinc selenide
Imura et al. Development of novel near-field microspectroscopy and imaging of local excitations and wave functions of nanomaterials
Zhang et al. High-vacuum tip enhanced Raman spectroscopy
Jakob et al. Accelerated molecular vibrational decay and suppressed electronic nonlinearities in plasmonic cavities through coherent Raman scattering
Bründermann et al. SNIM: Scanning near-field infrared microscopy
Roelli et al. In-operando control of sum-frequency generation in tip-enhanced nanocavities
Plathier et al. Permittivity imaged at the nanoscale using tip-enhanced Raman spectroscopy
US20240168053A1 (en) Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR
Zhang et al. Basics and practice of surface enhanced Raman scattering (SERS) and Tip Enhanced Raman scattering (TERS)
Lee et al. Measurement of scattering nonlinearities from a single plasmonic nanoparticle
Zhang Near-Field Imaging Via Localized Surface Plasmon Resonance Enhanced Gold Photoluminescence
Tiwari et al. Spatially-resolved fluorescence-detected two-dimensional electronic spectroscopy probes varying electronic couplings in photosynthetic bacteria
Kawata et al. Optical Nano-Imaging of Materials: Peeping Through Tip-Enhanced Raman Scattering