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Rodriguez-Davila et al., 2019 - Google Patents

A new integration-based procedure to extract the threshold voltage, the mobility enhancement factor, and the series resistance of thin-film MOSFETs

Rodriguez-Davila et al., 2019

Document ID
17311892135579982108
Author
Rodriguez-Davila R
Ortiz-Conde A
Avila-Avendano C
Quevedo-Lopez M
Publication year
Publication venue
IEEE Transactions on Electron Devices

External Links

Snippet

A method is presented to extract the series resistance, the threshold voltage, and the mobility enhancement factor of thin-film MOSFETs. This integration-based method, which only requires measuring the saturation drain current from a single test device, was tested …
Continue reading at ieeexplore.ieee.org (other versions)

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