Nothing Special   »   [go: up one dir, main page]

Sladky, 1979 - Google Patents

Production interferometric testing of diamond-turned surfaces

Sladky, 1979

Document ID
17160508553521355861
Author
Sladky R
Publication year
Publication venue
Interferometry

External Links

Snippet

Metal mirrors of conventional and nonconventional design can be machined by the diamond- turning process. A wide variety of optical test equipment is needed to aid in the production of these mirrors and to provide final certification. Optical testing procedures require quality …
Continue reading at www.spiedigitallibrary.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing of optical properties of lenses
    • G01M11/0242—Testing of optical properties of lenses by measuring geometrical properties or aberrations
    • G01M11/0271—Testing of optical properties of lenses by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/30—Measuring arrangements characterised by the use of optical means for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
    • G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
    • G01B9/02015—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by a particular beam path configuration
    • G01B9/02022—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by a particular beam path configuration contacting one object by grazing incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Similar Documents

Publication Publication Date Title
US8345262B2 (en) Method and apparatus for determining a deviation of an actual shape from a desired shape of an optical surface
Takacs et al. Long trace profile measurements on cylindrical aspheres
US7728987B2 (en) Method of manufacturing an optical element
WO2021203707A1 (en) Automatic surface shape measurement apparatus and method using laser interferometry
Neal et al. Wavefront sensors for control and processing monitoring in optics manufacture
Griesmann et al. Three-flat tests including mounting-induced deformations
CN109631767B (en) Distance measuring method
Murty et al. Measurement of long radius of curvature
Takacs et al. Surface topography measurements over the 1 meter to 10 micrometer spatial period bandwidth
Sladky Production interferometric testing of diamond-turned surfaces
Assoufid et al. Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories
Stevens Zone-plate interferometers
Shagam et al. Optical figure inspection of diamond-turned metal mirrors
Daly et al. Mach Zehnder interferometer for measuring microlenses
Kwo et al. Hartmann-Shack wavefront sensor using a binary optic lenslet array
Quercioli et al. Optical surface profile transducer
Wagner Design of a measuring machine for optical filters
Chen et al. 3D profile measurement of a cylindrical surface with a multi-beam angle sensor
Bryan et al. Diamond turning of parabolic mirrors
Bennett et al. Test facility for long-focal-length mirrors
Arnold et al. Machining Nonconventional-Shaped Optics
Baryshnikov et al. Precision method of monitoring the parameters of the local nanometer-level deviations of an optical component’s surface
Takacs et al. Metrology of Large Cylinder Mirrors with a Scanning Optical Profiler
Lunt et al. XUV synchrotron optical components for the Advanced Light Source: fabrication and metrology
Loomis Analysis of interferograms from waxicons