Nothing Special   »   [go: up one dir, main page]

Azeez et al., 2018 - Google Patents

Establishing a new form of primary impedance standard at millimeter-wave frequencies

Azeez et al., 2018

View PDF
Document ID
16979606305300421505
Author
Azeez Y
Collier R
Ridler N
Young P
Publication year
Publication venue
IEEE Transactions on Instrumentation and Measurement

External Links

Snippet

This paper investigates the possibility of using layers of graphene to form primary impedance standards for millimeter-wave rectangular metallic waveguide. It is shown that standards with values of, and can be produced by a monolayer, bilayer, or trilayer of …
Continue reading at ieeexplore.ieee.org (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material

Similar Documents

Publication Publication Date Title
US6472885B1 (en) Method and apparatus for measuring and characterizing the frequency dependent electrical properties of dielectric materials
US8577632B2 (en) System and method for identification of complex permittivity of transmission line dielectric
Shete et al. Design of a coplanar sensor for RF characterization of thin dielectric samples
CN112505429B (en) Complex dielectric constant test system and test method based on coaxial strip line resonator
US20100001742A1 (en) Calibration technique
CN106018973B (en) A kind of micro-strip test nano thin-film Micro-wave low-noise transistor device
CN205786867U (en) A kind of nano thin-film Micro-wave low-noise transistor test device
Hinojosa S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties
Quéffélec et al. Broad-band characterization of magnetic and dielectric thin films using a microstrip line
Tiwari et al. Novel microstrip-based simplified approach for fast determination of substrate permittivity
US20030115008A1 (en) Test fixture with adjustable pitch for network measurement
Eccleston A new interpretation of through-line deembedding
Kitano et al. Broadband method for precise microwave spectroscopy of superconducting thin films near the critical temperature
CN105929346B (en) A kind of device and its measurement method of contactless vector network high temperature test film magnetic conductivity
Shin et al. Broadband coaxial S-parameter measurements for cryogenic quantum technologies
Azeez et al. Establishing a new form of primary impedance standard at millimeter-wave frequencies
Chung et al. Broadband radio frequency conductivity measurement technique for engineered composites
Ziadé et al. Primary standard for S-parameter measurements at intermediate frequencies (IFs)
Stutzman et al. Broadband calibration of long lossy microwave transmission lines at cryogenic temperatures using nichrome films
Dvorsky et al. Microwave surface conductivity measurement using an open-ended circular waveguide probe
Drisko et al. Optimal series resistors for on-wafer calibrations
Röper et al. Propagation, dissipation, and breakdown in quantum anomalous Hall edge states probed by microwave edge plasmons
US11754605B2 (en) Series tee splitter for impedance measurements
CN106501617B (en) Calibration method of dielectric material measurement piece, short circuit calibration piece, dielectric material measurement method and device
Xu et al. Nondestructive measurements of the resistivity of thin conductive films and the dielectric constant of thin substrates using an open-ended coaxial line