Schweikhard et al., 1995 - Google Patents
Excitation and detection of ICR modes for control and analysis of a multicomponent plasmaSchweikhard et al., 1995
- Document ID
- 16817923557923398911
- Author
- Schweikhard L
- Ziegler J
- Beiersdorfer P
- Beck B
- Becker S
- Elliott S
- Publication year
- Publication venue
- Review of scientific instruments
External Links
Snippet
Methods are being developed to analyze and control the ionic composition of a confined plasma with use of ion cyclotron modes. Resolving powers much higher than possible with time‐of‐flight analysis are achieved. Selected heating and removal of a given species from …
- 210000002381 Plasma 0 title abstract description 21
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
- H01J49/38—Omegatrons Using ion cyclotron resonance
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/0027—Methods for using particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6452168B1 (en) | Apparatus and methods for continuous beam fourier transform mass spectrometry | |
| EP0818054B1 (en) | Mass spectrometer | |
| US4959543A (en) | Method and apparatus for acceleration and detection of ions in an ion cyclotron resonance cell | |
| US6852972B2 (en) | Mass spectrometer | |
| EP0113207A2 (en) | Method of mass analyzing a sample by use of a quadrupole ion trap | |
| EP0747929B1 (en) | Method of using a quadrupole ion trap mass spectrometer | |
| JPS594829B2 (en) | Method and apparatus for Fourier transform ion and cyclotron resonance mass spectrometry | |
| US4105917A (en) | Method and apparatus for mass spectrometric analysis at ultra-low pressures | |
| Kwiatkowski et al. | Isobaric beam purification for high precision Penning trap mass spectrometry of radioactive isotope beams with SWIFT | |
| CN111029242A (en) | Ion signal detection device and method for quadrupole rod mass analyzer | |
| Chen et al. | Direct charge number and molecular weight determination of large individual ions by electrospray ionization Fourier transform ion cyclotron resonance mass spectrometry | |
| US6573495B2 (en) | High capacity ion cyclotron resonance cell | |
| US5047636A (en) | Linear prediction ion cyclotron resonance spectrometry apparatus and method | |
| Beiersdorfer et al. | First Fourier‐transform ion cyclotron resonance signals of very highly charged atomic ions | |
| Schweikhard et al. | Excitation and detection of ICR modes for control and analysis of a multicomponent plasma | |
| US5455418A (en) | Micro-fourier transform ion cyclotron resonance mass spectrometer | |
| Schweikhard et al. | Fourier Transform Ion Cyclotron Resonance of highly-charged atomic ions | |
| Medhe | Mass Spectrometry: Analysers an Important Tool | |
| CN210897193U (en) | Ion signal detection device for quadrupole rod mass analyzer | |
| Beiersdorfer et al. | Fourier transform-ion cyclotron resonance mass spectrometry—A new tool for measuring highly charged ions in an electron beam ion trap | |
| Breitenfeldt et al. | Spreading times of ion-bunches in the Cryogenic Trap for Fast ion beams | |
| Weil et al. | Axial ion motion within the quadrupole ion trap elucidated by dc pulse tomography | |
| Zerega et al. | A dual quadrupole ion trap mass spectrometer | |
| Cooks et al. | Quadrupole mass filters and quadrupole ion traps | |
| JP3531925B2 (en) | Sample ionization method, ion source and mass spectrometer |