Bechou et al., 1996 - Google Patents
Non‐destructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonancesBechou et al., 1996
- Document ID
- 16681049181110362967
- Author
- Bechou L
- Mejdi S
- Ousten Y
- Danto Y
- Publication year
- Publication venue
- Quality and reliability engineering international
External Links
Snippet
High reliability multilayer ceramic chip capacitors are necessary for use in surface mounting processes which are more mechanically and thermally severe than the traditional through‐ hole processes. Moreover, in specific environments, even a small defect can be considered …
- 239000003990 capacitor 0 title abstract description 59
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02818—Density, viscosity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02827—Elastic parameters, strength or force
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezo-electric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/562—Monolithic crystal filters comprising a ceramic piezoelectric layer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/10—Number of transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Slabki et al. | Anisotropy of the high‐power piezoelectric properties of Pb (Zr, Ti) O3 | |
Yamada et al. | 1P2-5 Variation in Resonance Characteristics of a Backward-Wave-Type Trapped-Energy Resonator Caused by Dipping in Liquids | |
US8487712B2 (en) | System for transmitting an electric pulse and device for capacitive disconnection for such a system | |
WO2023074627A1 (en) | Capacitor inspection method and inspection device used in capacitor inspection method | |
Bechou et al. | Non‐destructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances | |
CA1237772A (en) | Nondestructive testing of multilayers ceramic capacitors | |
Hu et al. | Characterization of temperature dependence of dielectric, elastic and piezoelectric properties of BaTiO3 ceramics | |
Chen et al. | Partial discharge test circuit as a spark-gap transmitter | |
Fett et al. | Measurement of Young's moduli for lead zirconate titanate (PZT) ceramics | |
Wang et al. | Damage detection using piezoelectric admittance approach with inductive circuitry | |
Boser et al. | Electromechanical resonances in ceramic capacitors and their use for rapid nondestructive testing | |
Edwards et al. | Lead-free transducer for non-destructive evaluation | |
Ramos et al. | Electrical matching effects on the piezoelectric transduction performance of a through-transmission pulsed process | |
Freer et al. | The Mechanical Behaviour of Multilayer Ceramic Capacitors—Applied Stresses and Testing Techniques | |
Hamidouche et al. | Very high spatial resolution space charge measurement using electro-acoustic reflectometry (EAR) | |
Love et al. | Acoustic microscopy of ceramic capacitors | |
Prume et al. | Finite‐Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test | |
Krieger et al. | Defect detection in multilayer ceramic capacitors | |
JPH07174802A (en) | Method for detecting internal crack in electronic part | |
Covaci et al. | Solutions for acoustic noise caused by multilayer ceramic capacitors | |
Najafi et al. | Effect of carbonized patterns on oil-impregnated aramid pressboards surface on acoustic emission signals at inhomogeneous electric field | |
Ousten et al. | Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors | |
Kienemund et al. | Proceedings of the 48th European Microwave Conference Suppression of Acoustic Resonances in Fully-Printed, BST Thick Film Varactors Utilizing Double MIM Structures | |
Karlash | Analysis of the methods of determination of the viscoelastic coefficients of piezoceramic resonators | |
Wu et al. | Enhanced ability of defect detection using high voltage time-domain resonance analysis and impedance spectrum |