Nothing Special   »   [go: up one dir, main page]

Welsch et al., 1982 - Google Patents

Measurement of the extinction of sputtered TiO2 films

Welsch et al., 1982

Document ID
16233722036765850892
Author
Welsch E
Lieder G
Walther H
Hacker E
Publication year
Publication venue
Thin Solid Films

External Links

Snippet

In this paper a method for separate measurement of the extinction of optical thin films is presented. The method combines a laser calorimetric technique and a light-scattering goniophotometer. As an example, the spectral extinction properties of rf reactively sputtered …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Similar Documents

Publication Publication Date Title
Kaiser et al. High damage threshold Al2O3SiO2 dielectric coatings for excimer lasers
Bezuidenhout et al. The optical properties of YF3 films
Welsch et al. Measurement of the extinction of sputtered TiO2 films
Xu et al. Effects of different post-treatment methods on optical properties, absorption and nanosecond laser-induced damage threshold of Ta2O5 films
Hacker et al. Review of structural influences on the laser damage thresholds of oxide coatings
Stewart et al. The properties of laser annealed dielectric films
Levchuk et al. High-quality interference coatings for LBO and BBO crystals produced by the ion-beam technique
Shi et al. Mechanical and optical properties of oxide thin films deposited by pulsed laser reactive evaporation
Ashton et al. Optical properties of lead in the vacuum ultraviolet
Newnam et al. Short pulse CO 2-laser damage studies of NaCl and KCl windows
Zuber et al. Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Nichols et al. Large-spot DF laser damage of dielectric-enhanced mirrors
Porteus et al. Multithreshold Evaluation of 100-nsec Pulsed Laser Damage to Coating Materials at 2.7-and 3.8-µm Wavelengths
Temple et al. 2.8 OPTICAL PROPERTIES OF MIRRORS PREPARED BY ULTRACLEAN dc SPUTTER DEPOSITION
Min'ko et al. Effects of quasi-cw millisecond neodymium laser radiation pulses on metals
McLachlan et al. A NEW CHALCOGENIDE-GLASS ANTIREFLECTION COATING FOR KC1
Wang et al. 2.4 Pulsed CO2 Laser Damage in Windows, Reflectors, and Coatings
McNally et al. Properties of IAD single-and multi-layer oxide coatings
Welsch et al. Measurement of optical losses and damage resistance of ZnS Na3AlF6 and TiO2 SiO2 laser mirrors depending on coating design
Fedyushin et al. Plasma formation thresholds of solid targets irradiated with laser pulses of~ 10-12 and~ 10-10 s duration (wavelength λ= 1.06 μm)
Williams et al. USAFA/DFP
Zhang et al. Measurement of infrared absorption coefficients of molten glasses
Guenther et al. Microstructural and Physico-Chemical Investigations of Dielectric Multilayers
Newnam SHORT-PULSE C02-LASER DAMAGE STUDIES OF NaCI AND KCl WINDOWS Brian E. Newnam, Andrew V. Nowak, and Dennis H. Gill Los Alamos Scientific Laboratory Los Alamos, New Mexico 87545
Bernhardt et al. Damage frequency measurements and optical properties of NIR coatings produced by ion-assisted deposition