Nothing Special   »   [go: up one dir, main page]

Erb et al., 2011 - Google Patents

Design specification for BER analysis methods using built-in jitter measurements

Erb et al., 2011

Document ID
16292190446342905323
Author
Erb S
Pribyl W
Publication year
Publication venue
IEEE transactions on very large scale integration (VLSI) systems

External Links

Snippet

Timing jitter is a major limiting factor for data throughput in serial high-speed interfaces, which forces an accurate analysis of the impact on system performance. Histogram-based methods have been developed for this purpose, and can directly relate collected jitter …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L7/00—Arrangements for synchronising receiver with transmitter
    • H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

Similar Documents

Publication Publication Date Title
Chan et al. A jitter characterization system using a component-invariant Vernier delay line
JP5066077B2 (en) Probability density function separation apparatus, probability density function separation method, test apparatus, bit error rate measurement apparatus, electronic device, and program
US7899638B2 (en) Estimating bit error rate performance of signals
JP5255442B2 (en) Probability density function separation apparatus, probability density function separation method, program, test apparatus, bit error rate measurement apparatus, electronic device, and jitter transfer function measurement apparatus
EP1854237A2 (en) Measuring components of jitter
US9116204B2 (en) On-die all-digital delay measurement circuit
Polzer et al. An approach for efficient metastability characterization of FPGAs through the designer
JP2006292749A (en) Separation of random jitter component and deterministic jitter component
Liang et al. On-chip measurement of clock and data jitter with sub-picosecond accuracy for 10 Gb/s multilane CDRs
Yamaguchi et al. Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method
US10396911B1 (en) Noise analysis to reveal jitter and crosstalk's effect on signal integrity
Erb et al. Design specification for BER analysis methods using built-in jitter measurements
Martínez-Gómez et al. Calibration of ring oscillator PUF and TRNG
Cantoni et al. Characterization of a flip-flop metastability measurement method
Tzou et al. Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling
Hong et al. Bit-error-rate estimation for high-speed serial links
Duan et al. A low-cost comparator-based method for accurate decomposition of deterministic jitter in high-speed links
Le Gall et al. High frequency jitter estimator for SoCs
US11624781B2 (en) Noise-compensated jitter measurement instrument and methods
Alon et al. On-die power supply noise measurement techniques
Bidaj et al. Jitter definition, measurement, generation, analysis, and decomposition
Najvirt et al. Measuring metastability with free-running clocks
Ichiyama et al. Novel CMOS circuits to measure data-dependent jitter, random jitter, and sinusoidal jitter in real time
Ong et al. Random jitter extraction technique in a multi-gigahertz signal
Kuo et al. A period tracking based on-chip sinusoidal jitter extraction technique