Nothing Special   »   [go: up one dir, main page]

Cornish et al., 2000 - Google Patents

Miniature time‐of‐flight mass spectrometer using a flexible circuitboard reflector

Cornish et al., 2000

View PDF
Document ID
15925847643637082391
Author
Cornish T
Ecelberger S
Brinckerhoff W
Publication year
Publication venue
Rapid Communications in Mass Spectrometry

External Links

Snippet

An innovative design for a miniature time‐of‐flight mass spectrometer has been developed employing several newly designed components. These include:(1) a gridless, focusing ion source allowing for the use of very high extraction energies in a maintenance‐free …
Continue reading at citeseerx.ist.psu.edu (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/10—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles

Similar Documents

Publication Publication Date Title
US6614020B2 (en) Gridless, focusing ion extraction device for a time-of-flight mass spectrometer
US6580070B2 (en) Time-of-flight mass spectrometer array instrument
AU2001261372A1 (en) Gridless, focusing ion extraction device for a time-of-flight mass spectrometer
US6943344B2 (en) Microchannel plate detector assembly for a time-of-flight mass spectrometer
EP2786399B1 (en) Method for automated checking and adjustment of mass spectrometer calibration
Cornish et al. Miniature time‐of‐flight mass spectrometer using a flexible circuitboard reflector
Steiner et al. Electrospray ionization with ambient pressure ion mobility separation and mass analysis by orthogonal time‐of‐flight mass spectrometry
Kempka et al. Improved method for peak picking in matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometry
Perreault et al. Experimental methods in chemical engineering: mass spectrometry—MS
Fjeldsted Advances in time-of-flight mass spectrometry
Chambers et al. Development of an ion store/time-of-flight mass spectrometer for the analysis of volatile compounds in air
Okumura et al. Application of a multi‐turn time‐of‐flight mass spectrometer, MULTUM II, to organic compounds ionized by matrix‐assisted laser desorption/ionization
US7115859B2 (en) Time- of flight mass spectrometers for improving resolution and mass employing an impulse extraction ion source
CN113205999B (en) Triple quadrupole/ion mobility switching type mass spectrometer
Ring et al. A comparative study of a liquid and a solid matrix in matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometry and collision cross section measurements
CN102820190A (en) Assembly method of quadrupole mass analyzer
Fancher et al. Improving the sensitivity of the end‐cap reflectron time‐of‐flight mass spectrometer
Yang et al. Development of a newly compact double-focusing mass spectrometer
AU2001263385A1 (en) Microchannel Plate Detector Assembly for a Time-of-flight Mass Spectrometer
Bereman et al. Mass measurement accuracy comparisons between a double‐focusing magnetic sector and a time‐of‐flight mass analyzer
Kumar et al. Development of an indigenous multi-collector inductively coupled plasma mass spectrometer
Park et al. A planar quadrupole device for transmitting and trapping ions in high vacuum
BHATIA Development of Magnetic Sector Mass Spectrometers for Isotopic Ratio Analysis
Frank et al. Ultra-high-mass mass spectrometry with charge discrimination using cryogenic detectors
Sysoev et al. High-luminosity ion source for mass spectrometers