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von Staudt et al., 2021 - Google Patents

Exploring and comparing IEEE P1687. 1 and IEEE 1687 modeling of non-TAP interfaces

von Staudt et al., 2021

View PDF
Document ID
15712695095528591695
Author
von Staudt H
Van Treuren B
Rearick J
Portolan M
Keim M
Publication year
Publication venue
2021 IEEE European Test Symposium (ETS)

External Links

Snippet

The industry is moving forward with non-TAP, chip-level interfaces driving IEEE 1687-2014 networks. Recent literature not only describes such interfaces, like I 2 C and IEEE 1149.7 variants, but also demonstrates that such interfaces to IEEE 1687 are already proven in …
Continue reading at bradfordvt.github.io (PDF) (other versions)

Classifications

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    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G06F17/5054—Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for programme control, e.g. control unit
    • G06F9/06—Arrangements for programme control, e.g. control unit using stored programme, i.e. using internal store of processing equipment to receive and retain programme
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