Nothing Special   »   [go: up one dir, main page]

Schiavo et al., 2016 - Google Patents

High-resolution three-dimensional compositional imaging by double-pulse laser-induced breakdown spectroscopy

Schiavo et al., 2016

Document ID
15771895739548651032
Author
Schiavo C
Menichetti L
Grifoni E
Legnaioli S
Lorenzetti G
Poggialini F
Pagnotta S
Palleschi V
Publication year
Publication venue
Journal of Instrumentation

External Links

Snippet

In this paper we present a new instrument specifically realized for high-resolution three- dimensional compositional analysis and mapping of materials. The instrument is based on the coupling of a Double-Pulse Laser-Induced Breakdown Spectroscopy (LIBS) instrument …
Continue reading at iopscience.iop.org (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/04Devices for withdrawing samples in the solid state, e.g. by cutting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/102Different kinds of radiation or particles beta or electrons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/48Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials

Similar Documents

Publication Publication Date Title
Hodoroaba Energy-dispersive X-ray spectroscopy (EDS)
Schiavo et al. High-resolution three-dimensional compositional imaging by double-pulse laser-induced breakdown spectroscopy
Dobrowolska et al. Quantitative imaging of zinc, copper and lead in three distinct regions of the human brain by laser ablation inductively coupled plasma mass spectrometry
Escher et al. Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope
Tulej et al. Chemical composition of micrometer-sized filaments in an aragonite host by a miniature laser ablation/ionization mass spectrometer
Ripoll et al. Evaluation of Thin Film Microextraction for trace elemental analysis of liquid samples using LIBS detection
US20070076200A1 (en) Dual fiber microprobe for mapping elemental distributions in biological cells
Calligaro et al. Advances in elemental imaging of rocks using the AGLAE external microbeam
Grassi et al. Three-dimensional compositional mapping using double-pulse micro-laser-induced breakdown spectroscopy technique
Tian et al. Elemental analysis of powders with surface-assisted thin film laser-induced breakdown spectroscopy
Prochazka et al. Joint utilization of double-pulse laser-induced breakdown spectroscopy and X-ray computed tomography for volumetric information of geological samples
Romano et al. Micro X-ray fluorescence imaging in a tabletop full field-X-ray fluorescence instrument and in a full field-particle induced X-ray emission end station
Nassef et al. Surface and stratigraphic elemental analysis of an ancient Egyptian cartonnage using Laser-Induced Breakdown Spectroscopy (LIBS)
Zou et al. In situ analytical characterization and chemical imaging of tablet coatings using laser induced breakdown spectroscopy (LIBS)
Pandey et al. Effect of powder compact density on the LIBS analysis of Ni impurities in alumina powders
Delarue et al. Investigation of the geochemical preservation of ca. 3.0 Ga permineralized and encapsulated microfossils by nanoscale secondary ion mass spectrometry
Dalby et al. Analytical techniques for probing small-scale layers that preserve information on gas–solid interactions
Kotrly New Possibilities of Using Microscopic Techniques in Forensic Field
Magdy Analytical techniques for the preservation of cultural heritage: Frontiers in knowledge and application
Kühn et al. Pushing the limits for fast spatially resolved elemental distribution patterns
Siano et al. Spatially calibrated elemental depth profiling using LIPS and 3D digital microscopy
Szakal et al. Preparation and measurement methods for studying nanoparticle aggregate surface chemistry
EP3117448B1 (en) Device for correlative scanning transmission electron microscopy (stem) and light microscopy
Conti et al. Contrasting confocal XRF with micro-SORS: a deep view within micrometric painted stratigraphy
Orsilli et al. Angle Resolved-XRF analysis of Puebla ceramic decorations