Met et al., 2009 - Google Patents

Classifications

• • H—ELECTRICITY
  • H03—BASIC ELECTRONIC CIRCUITRY
  • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
  • H03H11/00—Networks using active elements
  • H03H11/02—Multiple-port networks
  • H03H11/04—Frequency selective two-port networks
  • H03H11/12—Frequency selective two-port networks using amplifiers with feedback
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
  • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
  • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
  • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
  • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage
  • G01R23/14—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison
  • G01R23/145—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison by heterodyning or by beat-frequency comparison with the harmonic of an oscillator
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
  • G01R19/02—Measuring effective values, i.e. root-mean-square values
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
  • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise
• • H—ELECTRICITY
  • H03—BASIC ELECTRONIC CIRCUITRY
  • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
  • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
  • H03H7/01—Frequency selective two-port networks
  • H03H7/17—Structural details of sub-circuits of frequency selective networks
  • H03H7/1741—Comprising typical LC combinations, irrespective of presence and location of additional resistors
  • H03H7/1775—Parallel LC in shunt or branch path
• • H—ELECTRICITY
  • H03—BASIC ELECTRONIC CIRCUITRY
  • H03F—AMPLIFIERS
  • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
  • H03F3/45—Differential amplifiers
  • H03F3/45071—Differential amplifiers with semiconductor devices only
  • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
  • H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit

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