Nothing Special   »   [go: up one dir, main page]

Göken et al., 1996 - Google Patents

Atomic force microscopy investigations of loaded crack tips in NiAl

Göken et al., 1996

Document ID
15659117186951776286
Author
Göken M
Vehoff H
Neumann P
Publication year
Publication venue
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

External Links

Snippet

Scanning probe microscopy has great advantages over other high‐resolution techniques like transmission electron microscopy in that no extensive specimen preparation, such as thinning, is required. This is important for examinations of crack tips, since thin film effects …
Continue reading at pubs.aip.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied

Similar Documents

Publication Publication Date Title
Fang et al. Machining characterization of the nano-lithography process using atomic force microscopy
Stach et al. Development of a nanoindenter for in situ transmission electron microscopy
Minor et al. Quantitative in situ nanoindentation in an electron microscope
Blank et al. Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C 60 tip
Lee et al. Residual stresses in DLC/Si and Au/Si systems: Application of a stress-relaxation model to the nanoindentation technique
Reimanis et al. Effects of plasticity on the crack propagation resistance of a metal/ceramic interface
US5602329A (en) Method and apparatus for measuring fracture toughness of a material
Trenkler et al. Evaluating probes for “electrical” atomic force microscopy
Kempf et al. Nanohardness measurements for studying local mechanical properties of metals.
Göken et al. Atomic force microscopy investigations of loaded crack tips in NiAl
US5500535A (en) Stress cell for a scanning probe microscope
Troyon et al. A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis
Bhushan Wear and mechanical characterisation on micro-to picoscales using AFM
Elmustafa et al. Indentation size effect: large grained aluminum versus nanocrystalline aluminum-zirconium alloys
Göken et al. Investigations of loaded crack tips in NiAl by atomic force microscopy
Stegemann et al. Spherical AFM probes for adhesion force measurements on metal single crystals
Sauthoff et al. Nonlinear dynamic instability in brittle fracture of GaAs
De Pablo et al. Adhesion maps using scanning force microscopy techniques
Goken et al. Atomic force microscope studies of the local slip at loaded crack tips in NiAl
Dongmo et al. Correction of surface roughness measurements in SPM imaging
Wadsak et al. A comparison of preparation methods of copper surfaces for in situ scanning force microscopy investigations
Wiesendanger et al. Surface step and defect structure of Cr (001) studied by scanning tunneling microscopy
Thornton Metal surface investigation by scanning probe microscopy
Kinoshita Stress singularity near the crack-tip in silicon carbide: investigation by atomic force microscopy
Qian et al. The experimental rules of mica as a reference sample of AFM/FFM measurement