Nothing Special   »   [go: up one dir, main page]

Akhter et al., 2016 - Google Patents

Free-space time domain position insensitive technique for simultaneous measurement of complex permittivity and thickness of lossy dielectric samples

Akhter et al., 2016

View PDF
Document ID
15503521310610896038
Author
Akhter Z
Akhtar M
Publication year
Publication venue
IEEE Transactions on Instrumentation and Measurement

External Links

Snippet

A novel time domain measurement technique is proposed to facilitate the simultaneous measurement of electrical properties (complex relative permittivity) and geometrical parameters (thickness) of the material under test (MUT). The overall process is noninvasive …
Continue reading at www.iitk.ac.in (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves
    • G01N22/04—Investigating moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/88—Radar or analogous systems specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/024—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00 using polarisation effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/02—Systems using reflection of radio waves, e.g. primary radar systems; Analogous systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/03—Details of HF subsystems specially adapted therefor, e.g. common to transmitter and receiver

Similar Documents

Publication Publication Date Title
Akhter et al. Free-space time domain position insensitive technique for simultaneous measurement of complex permittivity and thickness of lossy dielectric samples
Hasar et al. Complex permittivity and thickness evaluation of low-loss dielectrics from uncalibrated free-space time-domain measurements
Akhter et al. Time domain microwave technique for dielectric imaging of multi-layered media
Li et al. Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement
Severo et al. Non-resonant permittivity measurement methods
Haddadi et al. Geometrical optics-based model for dielectric constant and loss tangent free-space measurement
Ramzan et al. A complex permittivity extraction method based on anomalous dispersion
Sadeghi et al. A pole-extraction algorithm for wall characterization in through-the-wall imaging systems
Degli-Esposti et al. A method for the electromagnetic characterization of construction materials based on Fabry–Pérot resonance
Rudd et al. Determining high-frequency conductivity based on shielding effectiveness measurement using rectangular waveguides
Stewart et al. Electromagnetic characterization of a magnetic material using an open-ended waveguide probe and a rigorous full-wave multimode model
Khanal et al. Measurement of dielectric properties at 75-325 GHz using a vector network analyzer and full wave simulator
Tiwari et al. Simplified approach for broadband RF testing of low loss magneto-dielectric samples
Hasar et al. Method for electromagnetic property extraction of sublayers in metal-backed inhomogeneous metamaterials
You et al. Free-space measurement using explicit, reference-plane and thickness-invariant method for permittivity determination of planar materials
Krraoui et al. Nondestructive measurement of complex permittivity by a microwave technique: detection of contamination and food quality
You Effects of sample thickness for dielectric measurements using transmission phase-shift method
Aman et al. A free space frequency‐time‐domain technique for electromagnetic characterization of materials using reflection‐based measurement
Çolak et al. A new error reduction technique for reflection coefficient measurements for use in quick laboratory tests
Hasar et al. Non-Iterative and Stable Permittivity Extraction of Solid Dielectrics Using a New Formalism Based on Frequency-Domain and Time-Domain Analyses
Haraz et al. Detection of metallic and nonmetallic concealed targets based on millimeter‐wave inverse scattering approach
Tamyis et al. Free space measurement of complex permittivity and complex permeability of magnetic materials using open circuit and short circuit method at microwave frequencies
Havrilla et al. EM material characterization of conductor backed media using a NDE microstrip probe
Hasar Microwave method for thickness-independent permittivity extraction of low-loss dielectric materials from transmission measurements
Singh et al. A free space technique for dielectrics and building materials characterization for future 5G applications