Nothing Special   »   [go: up one dir, main page]

Azadmand et al., 2020 - Google Patents

Self‐Assembly of Well‐Separated AlN Nanowires Directly on Sputtered Metallic TiN Films

Azadmand et al., 2020

View PDF
Document ID
14741820159868962989
Author
Azadmand M
Auzelle T
Lähnemann J
Gao G
Nicolai L
Ramsteiner M
Trampert A
Sanguinetti S
Brandt O
Geelhaar L
Publication year
Publication venue
physica status solidi (RRL)–Rapid Research Letters

External Links

Snippet

Herein, the self‐assembled formation of AlN nanowires (NWs) by molecular beam epitaxy on sputtered TiN films on sapphire is demonstrated. This choice of substrate allows growth at an exceptionally high temperature of 1180° C. In contrast to previous reports, the NWs are …
Continue reading at onlinelibrary.wiley.com (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL-GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL-GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL-GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed material
    • C30B23/02Epitaxial-layer growth

Similar Documents

Publication Publication Date Title
Kehagias et al. Indium migration paths in V-defects of InAlN grown by metal-organic vapor phase epitaxy
Kumaresan et al. Self-induced growth of vertical GaN nanowires on silica
Albert et al. Selective area growth and characterization of InGaN nano-disks implemented in GaN nanocolumns with different top morphologies
Fitouri et al. Study of GaAsBi MOVPE growth on (1 0 0) GaAs substrate under high Bi flow rate by high resolution X-ray diffraction
Landré et al. Molecular beam epitaxy growth and optical properties of AlN nanowires
Gogova et al. Strain-free bulk-like GaN grown by hydride-vapor-phase-epitaxy on two-step epitaxial lateral overgrown GaN template
Gačević et al. Crystallographically uniform arrays of ordered (In) GaN nanocolumns
Budde et al. Plasma-assisted molecular beam epitaxy of NiO on GaN (00.1)
Sobanska et al. Enhanced catalyst-free nucleation of GaN nanowires on amorphous Al2O3 by plasma-assisted molecular beam epitaxy
Mukherjee et al. Growth and luminescence of polytypic InP on Epitaxial graphene
Azadmand et al. Self‐Assembly of Well‐Separated AlN Nanowires Directly on Sputtered Metallic TiN Films
Eftychis et al. Understanding the effects of Si (111) nitridation on the spontaneous growth and properties of GaN nanowires
Van Nostrand et al. Molecular beam epitaxial growth of high-quality GaN nanocolumns
Kang et al. Precursor flow rate manipulation for the controlled fabrication of twin-free GaAs nanowires on silicon substrates
Paskova et al. Influence of growth rate on the structure of thick GaN layers grown by HVPE
Freitas Jr Optical studies of bulk and homoepitaxial films of III–V nitride semiconductors
Chauhan et al. Evidence of relationship between strain and In-incorporation: Growth of N-polar In-rich InAlN buffer layer by OMCVD
Faleev et al. Depth dependence of defect density and stress in GaN grown on SiC
Van der Laak et al. Characterization of InGaN quantum wells with gross fluctuations in width
Schlykow et al. Selective growth of fully relaxed GeSn nano-islands by nanoheteroepitaxy on patterned Si (001)
Knoll et al. Growth, microstructure and morphology of epitaxial ScGaN films
Gačević et al. Structural and optical properties of self-assembled AlN nanowires grown on SiO2/Si substrates by molecular beam epitaxy
Gundimeda et al. Investigation of wurtzite formation in MOVPE-grown zincblende GaN epilayers on AlxGa1− xN nucleation layers
Omanakuttan et al. Epitaxial lateral overgrowth of GaxIn1− xP toward direct GaxIn1− xP/Si heterojunction
Schupp et al. MBE growth of cubic AlN on 3C‐SiC substrate