Nothing Special   »   [go: up one dir, main page]

Wuu et al., 2011 - Google Patents

Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching

Wuu et al., 2011

Document ID
14455506495981571932
Author
Wuu J
Pikus F
Marek-Sadowska M
Publication year
Publication venue
Design for Manufacturability through Design-Process Integration V

External Links

Snippet

Early lithographic hotspot detection has become increasingly important in achieving lithography-friendly designs and manufacturability closure. Fast physical verification tools employing pattern matching or machine learning techniques have emerged as great options …
Continue reading at www.spiedigitallibrary.org (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/12Design for manufacturability
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62Methods or arrangements for recognition using electronic means
    • G06K9/6267Classification techniques
    • G06K9/6268Classification techniques relating to the classification paradigm, e.g. parametric or non-parametric approaches
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/36Image preprocessing, i.e. processing the image information without deciding about the identity of the image
    • G06K9/46Extraction of features or characteristics of the image
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequence
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N99/00Subject matter not provided for in other groups of this subclass

Similar Documents

Publication Publication Date Title
Wuu et al. Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching
US10846454B2 (en) Integrated circuits having in-situ constraints
US11087066B2 (en) Static voltage drop (SIR) violation prediction systems and methods
Ding et al. High performance lithographic hotspot detection using hierarchically refined machine learning
Wuu et al. Rapid layout pattern classification
Ding et al. High performance lithography hotspot detection with successively refined pattern identifications and machine learning
Yu et al. Machine learning and pattern matching in physical design
US9430606B2 (en) Failure analysis and inline defect characterization
Lin et al. A novel fuzzy matching model for lithography hotspot detection
US20130031518A1 (en) Hybrid Hotspot Detection
US8069432B2 (en) Method and system for performing statistical leakage characterization, analysis, and modeling
Werner et al. Reverse engineering of cryptographic cores by structural interpretation through graph analysis
Madkour et al. Hotspot detection using machine learning
TWI733221B (en) Systematic fault localizaion system and systematic fault localization method
Tam et al. LASIC: Layout analysis for systematic IC-defect identification using clustering
CN115270705A (en) Design rule violation prediction method, device, equipment and storage medium
Pradhan et al. Predicting ${X} $-Sensitivity of circuit-inputs on test-coverage: a machine-learning approach
Tam et al. Systematic defect identification through layout snippet clustering
Li et al. An efficient approach for DRC hotspot prediction with convolutional neural network
Hong et al. Asic circuit netlist recognition using graph neural network
US20230044517A1 (en) Digital circuit representation using a spatially resolved netlist
Wuu et al. Detecting context sensitive hot spots in standard cell libraries
Li et al. Learning point clouds in eda
Mostafa et al. Multi-selection method for physical design verification applications
Kataoka et al. Novel feature vectors considering distances between wires for lithography hotspot detection