Nothing Special   »   [go: up one dir, main page]

Lancry et al., 2011 - Google Patents

Time-resolved plasma measurements in Ge-doped silica exposed to infrared femtosecond laser

Lancry et al., 2011

View PDF
Document ID
13984152941593144335
Author
Lancry M
Groothoff N
Poumellec B
Guizard S
Fedorov N
Canning J
Publication year
Publication venue
Physical Review B—Condensed Matter and Materials Physics

External Links

Snippet

Using a time-resolved interferometric technique, we study the laser-induced carrier-trapping dynamics in SiO 2 and Ge-doped SiO 2. The fast trapping of electrons in the band gap is associated with the formation of self-trapped excitons (STE). The STE trapping is doping …
Continue reading at research.tue.nl (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • G01N2021/653Coherent methods [CARS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains

Similar Documents

Publication Publication Date Title
Lancry et al. Time-resolved plasma measurements in Ge-doped silica exposed to infrared femtosecond laser
Couairon et al. Filamentation and damage in fused silica induced by tightly focused femtosecond laser pulses
Mao et al. Imaging femtosecond laser-induced electronic excitation in glass
Audebert et al. Space-time observation of an electron gas in Si O 2
Puerto et al. Dynamics of plasma formation, relaxation, and topography modification induced by femtosecond laser pulses in crystalline and amorphous dielectrics
Lancry et al. Ultrafast nanoporous silica formation driven by femtosecond laser irradiation
Hongjie et al. Subsurface defects of fused silica optics and laser induced damage at 351 nm
Williams et al. Short-pulse optical studies of exciton relaxation and F-center formation in NaCl, KCl, and NaBr
Buczynski et al. Supercontinuum generation up to 2.5 μm in photonic crystal fiber made of lead-bismuth-galate glass
Albrecht et al. Chirp measurement of large-bandwidth femtosecond optical pulses using two-photon absorption
Leyder et al. Non-linear absorption of focused femtosecond laser pulses at 1.3 μm inside silicon: Independence on doping concentration
Lanzillotti-Kimura et al. Bloch oscillations of THz acoustic phonons in coupled nanocavity structures
Meng et al. Ultrafast dynamic conductivity and scattering rate saturation of photoexcited charge carriers in silicon investigated with a midinfrared continuum probe
Okell et al. Temporal broadening of attosecond photoelectron wavepackets from solid surfaces
Hayasaki et al. Time-resolved axial-view of the dielectric breakdown under tight focusing in glass
Prell et al. Simulation of attosecond‐resolved imaging of the plasmon electric field in metallic nanoparticles
Haglund Jr et al. Nonlinear index of refraction of Cu-and Pb-implanted fused silica
Wilcox et al. Comparison of pulse compression methods using only a pulse shaper
Di Francesca et al. Resonance Raman of oxygen dangling bonds in amorphous silicon dioxide
WO2019056127A1 (en) Linear time-gate method and system for ultrashort pulse characterization
Lancry et al. Femtosecond laser direct processing in wet and dry silica glass
Kim et al. Chirp-independent time-resolved spectroscopy using the self-reference method
Chu et al. In-situ luminescence studies of silica glass during low energy H+, He+ and O+ irradiation
Lancry et al. Comparison Between Plasma Properties And Damage Thresholds In Doped Silica Exposed To IR Temtosecond Laser.
Wang et al. Direct observation of bulk second-harmonic generation inside a glass slide with tightly focused optical fields