Nothing Special   »   [go: up one dir, main page]

Shibata, 2010 - Google Patents

Measurement of complex permittivity for liquid materials using the open-ended cut-off waveguide reflection method

Shibata, 2010

View PDF
Document ID
13372428839923644107
Author
Shibata K
Publication year
Publication venue
IEICE transactions on electronics

External Links

Snippet

Various studies of specific absorption rates (SARs) using liquid phantoms imitating human body tissues have been widely carried out in electromagnetic compatibility (EMC) research fields. In order to establish accurate SARs for measurement, a faithful mockup of human …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/12—Coupling devices having more than two ports
    • H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
    • H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/24—Terminating devices
    • H01P1/26—Dissipative terminations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced with unbalanced lines or devices
    • H01P5/107—Hollow-waveguide/strip-line transitions
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/22—Attenuating devices
    • H01P1/222—Waveguide attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/02—Coupling devices of the waveguide type with invariable factor of coupling
    • H01P5/022—Transitions between lines of the same kind and shape, but with different dimensions
    • H01P5/026—Transitions between lines of the same kind and shape, but with different dimensions between coaxial lines

Similar Documents

Publication Publication Date Title
Shibata Measurement of complex permittivity for liquid materials using the open-ended cut-off waveguide reflection method
Barry A broad-band, automated, stripline technique for the simultaneous measurement of complex permittivity and permeability
Bois et al. Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials
Catala-Civera et al. Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides
Janezic et al. Complex permittivity determination from propagation constant measurements
CN100568000C (en) Dielectric materials high-temperature complex dielectric constant measuring method based on terminal short circuit
Arbaoui et al. Full 3-D printed microwave termination: A simple and low-cost solution
CN101545931B (en) Method for measuring high-temperature complex dielectric constants based on terminal short-circuit method
Huynen et al. A wideband line-line dielectrometric method for liquids, soils, and planar substrates
Maode et al. An improved open-ended waveguide measurement technique on parameters/spl epsiv//sub/spl gamma//and/spl mu//sub/spl gamma//of high-loss materials
Shibata Improvement in liquid permittivity measurement using the cut-off waveguide reflection method
McLaughlin et al. Miniature open-ended coaxial probes for dielectric spectroscopy applications
Shibata Calibration of a Coaxial-Loaded Stepped Cut-Off Circular Waveguide and Related Application of Dielectric Measurement for Liquids
Shibata et al. Measurement of complex permittivity for liquids using the coaxial line reflection method
Shibata S11 Calculation for a Coaxial-loaded-type Stepped Cut-off Circular Waveguide by the Moment Method
Shibata S 11 Calibration of Cut-Off Circular Waveguide with Three Materials and Related Application to Dielectric Measurement for Liquids
Green et al. One-port time domain measurement technique for quality factor estimation of loaded and unloaded cavities
SHIBATA et al. Measurement of complex permittivity for liquid phantom by transmission line method using coaxial line
Wolfson et al. Complex permittivity and permeability measurement using a rectangular waveguide
Cheng et al. Multifrequency measurements of dielectric properties using a transmission-type overmoded cylindrical cavity
Huang et al. Characterization of highly dispersive materials using composite coaxial cells: Electromagnetic analysis and wideband measurement
Wang et al. Experimental and numerical study of the radiation from microstrip bends
Lim et al. Simple and improved dielectric parameter extraction of thin organic packaging materials using open-ended coaxial line technique
柴田幸司 et al. Dielectric Measurement of Liquids Based on the Open-Ended Coaxial Line Reflection Method
Hasar et al. Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements