Ivanov et al., 2003 - Google Patents
Ring-resonator method-effective procedure for investigation of microstrip lineIvanov et al., 2003
- Document ID
- 13198174647366671113
- Author
- Ivanov S
- Peshlov V
- Publication year
- Publication venue
- IEEE Microwave and Wireless Components Letters
External Links
Snippet
In addition to the traditional application of the ring-resonator method for determination of the microstrip line effective permittivity, measurements of the insertion losses and equivalent substrate permittivity are proposed. The obtained data for a number of isotropic and …
- 238000000034 method 0 title description 11
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/12—Coupling devices having more than two ports
- H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
- H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of aerials; Antenna testing in general
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Wang et al. | Broadband printed-circuit-board characterization using multimode substrate-integrated-waveguide resonator | |
Latti et al. | A review of microstrip T-resonator method in determining the dielectric properties of printed circuit board materials | |
Cheng et al. | W-band characterizations of printed circuit board based on substrate integrated waveguide multi-resonator method | |
Shete et al. | Design of a coplanar sensor for RF characterization of thin dielectric samples | |
Ivanov et al. | Ring-resonator method-effective procedure for investigation of microstrip line | |
Zelenchuk et al. | Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators | |
Heinola et al. | Dielectric characterization of printed wiring board materials using ring resonator techniques: A comparison of calculation models | |
Hinojosa | S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties | |
Peterson et al. | A CPW T-resonator technique for electrical characterization of microwave substrates | |
CN111880012B (en) | Method for detecting broadband continuous dielectric characteristic parameters of microwave dielectric substrate | |
Kato et al. | Permittivity measurements and associated uncertainties up to 110 GHz in circular-disk resonator method | |
Kumar et al. | Broadband rectangular waveguide to suspended stripline transition using dendritic structure | |
Hienonen et al. | Effect of load impedance on passive intermodulation measurements | |
Dvorsky et al. | Microwave surface conductivity measurement using an open-ended circular waveguide probe | |
Fang et al. | A tunable split resonator method for nondestructive permittivity characterization | |
Latti et al. | A review of microstrip T-resonator method in determination of dielectric properties of printed circuit board materials | |
Heinola et al. | A strip line ring resonator method for determination of dielectric properties of printed circuit board material in function of frequency | |
Shwaykani et al. | A new calculation method for the dielectric constant of low-loss materials | |
Fulford et al. | Conductor and dielectric‐property extraction using microstrip tee resonators | |
CN115842234B (en) | Strip line resonator | |
Chramiec et al. | Design of impedance-transforming microstrip-balanced stripline tapered transitions | |
Chung et al. | A Method for Measuring Dielectric Properties of Dielectric Laminates | |
Zhang et al. | Extraction of dispersive material parameters using vector network analyzers and genetic algorithms | |
Wuensch et al. | Investigation and optimization of LEKID coupling structures and multi-pixel arrays at 4.2 K | |
Jaschke et al. | Novel multilayer SIW tapers synthesized using an extended transverse resonance method |