Nothing Special   »   [go: up one dir, main page]

Ivanov et al., 2003 - Google Patents

Ring-resonator method-effective procedure for investigation of microstrip line

Ivanov et al., 2003

Document ID
13198174647366671113
Author
Ivanov S
Peshlov V
Publication year
Publication venue
IEEE Microwave and Wireless Components Letters

External Links

Snippet

In addition to the traditional application of the ring-resonator method for determination of the microstrip line effective permittivity, measurements of the insertion losses and equivalent substrate permittivity are proposed. The obtained data for a number of isotropic and …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/12—Coupling devices having more than two ports
    • H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
    • H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor

Similar Documents

Publication Publication Date Title
Wang et al. Broadband printed-circuit-board characterization using multimode substrate-integrated-waveguide resonator
Latti et al. A review of microstrip T-resonator method in determining the dielectric properties of printed circuit board materials
Cheng et al. W-band characterizations of printed circuit board based on substrate integrated waveguide multi-resonator method
Shete et al. Design of a coplanar sensor for RF characterization of thin dielectric samples
Ivanov et al. Ring-resonator method-effective procedure for investigation of microstrip line
Zelenchuk et al. Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators
Heinola et al. Dielectric characterization of printed wiring board materials using ring resonator techniques: A comparison of calculation models
Hinojosa S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties
CN111880012B (en) Method for detecting broadband continuous dielectric characteristic parameters of microwave dielectric substrate
Kato et al. Permittivity measurements and associated uncertainties up to 110 GHz in circular-disk resonator method
Kumar et al. Broadband rectangular waveguide to suspended stripline transition using dendritic structure
Hienonen et al. Effect of load impedance on passive intermodulation measurements
Dvorsky et al. Microwave surface conductivity measurement using an open-ended circular waveguide probe
Fang et al. A tunable split resonator method for nondestructive permittivity characterization
Latti et al. A review of microstrip T-resonator method in determination of dielectric properties of printed circuit board materials
Heinola et al. A strip line ring resonator method for determination of dielectric properties of printed circuit board material in function of frequency
Shwaykani et al. A new calculation method for the dielectric constant of low-loss materials
Fulford et al. Conductor and dielectric‐property extraction using microstrip tee resonators
CN115842234B (en) Strip line resonator
Li et al. The impact of on-wafer calibration method on the measured results of coplanar waveguide circuits
Chramiec et al. Design of impedance-transforming microstrip-balanced stripline tapered transitions
Chung et al. A Method for Measuring Dielectric Properties of Dielectric Laminates
Zhang et al. Extraction of dispersive material parameters using vector network analyzers and genetic algorithms
Wuensch et al. Investigation and optimization of LEKID coupling structures and multi-pixel arrays at 4.2 K
Jaschke et al. Novel multilayer SIW tapers synthesized using an extended transverse resonance method