Liesener et al., 2004 - Google Patents
Active wavefront sensing and wavefront control with SLMsLiesener et al., 2004
- Document ID
- 12322851604035067042
- Author
- Liesener J
- Seifert L
- Tiziani H
- Osten W
- Publication year
- Publication venue
- Interferometry XII: Applications
External Links
Snippet
Active systems are becoming more and more prevalent in the the field of optical technology. These systems require not only means of controlling wavefronts but mostly also of sensing wavefronts. This paper shows in four examples how spatial light modulators can be utilized …
- 230000003287 optical 0 abstract description 34
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing of optical properties of lenses
- G01M11/0242—Testing of optical properties of lenses by measuring geometrical properties or aberrations
- G01M11/0257—Testing of optical properties of lenses by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B26/00—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
- G02B26/06—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating for controlling the phase of light
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/02—Details of features involved during the holographic process; Replication of holograms without interference recording
- G03H2001/0208—Individual components other than the hologram
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B26/00—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
- G02B26/08—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating for controlling the direction of light
- G02B26/0816—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/04—Processes or apparatus for producing holograms
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/0005—Adaptation of holography to specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/22—Processes or apparatus for obtaining an optical image from holograms
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B3/00—Simple or compound lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
- G02B27/0025—Other optical systems; Other optical apparatus for optical correction, e.g. distorsion, aberration
- G02B27/0037—Other optical systems; Other optical apparatus for optical correction, e.g. distorsion, aberration with diffracting elements
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Osten et al. | Evaluation and application of spatial light modulators for optical metrology | |
Bowman et al. | An SLM-based Shack–Hartmann wavefront sensor for aberration correction in opticaltweezers | |
EP1153263B1 (en) | Combining interference fringe patterns to a moire fringe pattern | |
Zhang et al. | LCoS display phase self-calibration method based on diffractive lens schemes | |
US7268937B1 (en) | Holographic wavefront sensor | |
Briers | Optical testing: a review and tutorial for optical engineers | |
Liesener et al. | Active wavefront sensing and wavefront control with SLMs | |
Reicherter et al. | Dynamic correction of aberrations in microscopic imaging systems using an artificial point source | |
Liesener et al. | Interferometer with dynamic reference | |
Nehmetallah | Multi-wavelength digital holographic microscopy using a telecentric reflection configuration | |
Pan et al. | Subaperture stitching interferometry based on digital holography | |
Reichelt et al. | Absolute interferometric test of Fresnel zone plates | |
Podanchuk et al. | Shack–Hartmann wavefront sensor with the precorrected holographic lenslet array | |
Haist et al. | Scene-based wavefront correction with spatial light modulators | |
Liesener et al. | Determination and compensation of aberrations using SLMs | |
Williby et al. | Interferometric testing of soft contact lenses | |
Tiziani et al. | Active wavefront shaping and analysis | |
Yang et al. | Shack-Hartmann wavefront sensing with super-resolution photon-sieve array | |
Chaudhuri et al. | Reconfigurable interferometry for freeform optics using a spatial light modulator | |
Son et al. | Characterization of distortions in electro-holographic image by a Shack-Hartmann wavefront sensor | |
Podanchuk et al. | Shack-Hartmann wavefront sensor with adaptive holographic lenslet array | |
Haist et al. | Dynamic holography and its application in measurement systems | |
Boruah | Zonal wavefront sensing using a liquid crystal spatial light modulator | |
Swain | Optical Differentiation Wavefront Sensor with Pixelated Filters Toward High Performance Metrology | |
Stuerwald et al. | DMD-based scanning of steep wavefronts for optical testing of freeform optics |