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El-Ashry et al., 2015 - Google Patents

A functional coverage approach for direct testing: An industrial IP as a case study

El-Ashry et al., 2015

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Document ID
10912392722427928900
Author
El-Ashry S
Salah K
Publication year
Publication venue
IEEE EUROCON 2015-International Conference on Computer as a Tool (EUROCON)

External Links

Snippet

Tracking the test-plan progress of the direct testing methodology is a manual process. If the test-plan is complicated, the manual tracking effort is huge. In this paper, an automated functional coverage method is proposed to be used along with direct testing in order to …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

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    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3676Test management for coverage analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
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    • G06F11/36Preventing errors by testing or debugging software
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    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
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    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
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    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/263Generation of test inputs, e.g. test vectors, patterns or sequences; with adaptation of the tested hardware for testability with external testers
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
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    • G01MEASURING; TESTING
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    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2201/00Indexing scheme relating to error detection, to error correction, and to monitoring

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