Ghodgaonkar et al., 1990 - Google Patents
Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequenciesGhodgaonkar et al., 1990
View PDF- Document ID
- 10776440043657589553
- Author
- Ghodgaonkar D
- Varadan V
- Varadan V
- Publication year
- Publication venue
- IEEE Transactions on instrumentation and measurement
External Links
Snippet
A free-space measurement system operating in the 8.2-40-GHz frequency range is used to measure the reflection and transmission coefficients, S/sub 11/and S/sub 21/, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from …
- 238000005259 measurement 0 title abstract description 62
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of aerials; Antenna testing in general
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/12—Coupling devices having more than two ports
- H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
- H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/24—Terminating devices
- H01P1/26—Dissipative terminations
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Ghodgaonkar et al. | Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies | |
Ghodgaonkar et al. | A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies | |
CN112505429B (en) | Complex dielectric constant test system and test method based on coaxial strip line resonator | |
Hasar et al. | Improved method for permittivity determination of dielectric samples by free-space measurements | |
Sahin et al. | A simplified Nicolson–Ross–Weir method for material characterization using single-port measurements | |
Sorocki et al. | Broadband microwave microfluidic coupled-line sensor with 3-D-printed channel for industrial applications | |
Decreton et al. | Nondestructive measurement of complex permittivity for dielectric slabs (short papers) | |
Varadan et al. | In situ microwave characterization of nonplanar dielectric objects | |
Li et al. | Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement | |
CN205786867U (en) | A kind of nano thin-film Micro-wave low-noise transistor test device | |
CN109061319A (en) | A kind of measuring electromagnetic parameters method based on rectangular cavity | |
Zaman et al. | Validation of ridge gap waveguide performance using in-house TRL calibration kit | |
CN114137316A (en) | Microwave sensor measuring method for nondestructive testing of material tiny dielectric fluctuation | |
Hossain et al. | Calibrated broadband measurement technique for complex permittivity and permeability | |
Malherbe et al. | The design of a slot array in nonradiating dielectric waveguide, Part II: Experiment | |
Ghodgaonkar et al. | Microwave nondestructive testing of composite materials using free-space microwave measurement techniques | |
Requena et al. | Wireless Complex Permittivity Measurement Using Resonant Scatterers and a Radar Approach | |
Kang | Free-space unknown thru measurement using planar offset short for material characterization | |
Tamyis et al. | Free space measurement of complex permittivity and complex permeability of magnetic materials using open circuit and short circuit method at microwave frequencies | |
CN109580661B (en) | Method for testing complex reflection coefficient of free space material | |
Kang | SOLR calibration using planar offset short in free-space material measurement | |
Chen et al. | An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency | |
Xu et al. | Electromagnetic characterization techniques for dielectric materials at millimeter-wave range | |
Zhang et al. | Measurement of anisotropic material by using orthomode transducer for high efficiency | |
Kang | One-port calibration of free-space material measurement system using planar offset short |