Nothing Special   »   [go: up one dir, main page]

Ghodgaonkar et al., 1990 - Google Patents

Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies

Ghodgaonkar et al., 1990

View PDF
Document ID
10776440043657589553
Author
Ghodgaonkar D
Varadan V
Varadan V
Publication year
Publication venue
IEEE Transactions on instrumentation and measurement

External Links

Snippet

A free-space measurement system operating in the 8.2-40-GHz frequency range is used to measure the reflection and transmission coefficients, S/sub 11/and S/sub 21/, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0807Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of aerials; Antenna testing in general
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00Coupling devices of the waveguide type
    • H01P5/12Coupling devices having more than two ports
    • H01P5/16Conjugate devices, i.e. devices having at least one port decoupled from one other port
    • H01P5/18Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G01R27/32Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2635Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06772High frequency probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878Sensors; antennas; probes; detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06Measuring reflection coefficients; Measuring standing-wave ratio
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/24Terminating devices
    • H01P1/26Dissipative terminations

Similar Documents

Publication Publication Date Title
Ghodgaonkar et al. Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
Ghodgaonkar et al. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
Bourreau et al. A Quasi-Optical Free-Space Measurement Setup Without Time-Domain Gating for Material Characterization in the $ W $-Band
CN112505429B (en) Complex dielectric constant test system and test method based on coaxial strip line resonator
Sahin et al. A simplified Nicolson–Ross–Weir method for material characterization using single-port measurements
Hasar et al. Improved method for permittivity determination of dielectric samples by free-space measurements
Sorocki et al. Broadband microwave microfluidic coupled-line sensor with 3-D-printed channel for industrial applications
Decreton et al. Nondestructive measurement of complex permittivity for dielectric slabs (short papers)
Varadan et al. In situ microwave characterization of nonplanar dielectric objects
Li et al. Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement
CN205786867U (en) A kind of nano thin-film Micro-wave low-noise transistor test device
CN109061319A (en) A kind of measuring electromagnetic parameters method based on rectangular cavity
Zaman et al. Validation of ridge gap waveguide performance using in-house TRL calibration kit
CN114137316A (en) Microwave sensor measuring method for nondestructive testing of material tiny dielectric fluctuation
Hossain et al. Calibrated broadband measurement technique for complex permittivity and permeability
Malherbe et al. The design of a slot array in nonradiating dielectric waveguide, Part II: Experiment
Requena et al. Wireless Complex Permittivity Measurement Using Resonant Scatterers and a Radar Approach
Ghodgaonkar et al. Microwave nondestructive testing of composite materials using free-space microwave measurement techniques
Kang Free-space unknown thru measurement using planar offset short for material characterization
CN109580661B (en) Method for testing complex reflection coefficient of free space material
Tamyis et al. Free space measurement of complex permittivity and complex permeability of magnetic materials using open circuit and short circuit method at microwave frequencies
Kang SOLR calibration using planar offset short in free-space material measurement
Chen et al. An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency
Xu et al. Electromagnetic characterization techniques for dielectric materials at millimeter-wave range
Zhang et al. Measurement of anisotropic material by using orthomode transducer for high efficiency