Beckloff et al., 1999 - Google Patents
Process‐Structure‐Reflectance Correlations for TiB2 Films Prepared by Chemical Vapor DepositionBeckloff et al., 1999
- Document ID
- 10108772389599692092
- Author
- Beckloff B
- Lackey W
- Publication year
- Publication venue
- Journal of the American Ceramic Society
External Links
Snippet
The process‐structure‐reflectance interrelationships for TiB2 films prepared by CVD were determined using statistically designed experiments. A hot wall CVD reactor employing graphite substrates and the TiCl4+ BCl3+ H2 reagent system were used at pressures of 2.7 …
- 229910033181 TiB2 0 title abstract 3
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- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
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