Nothing Special   »   [go: up one dir, main page]

Courts et al., 2002 - Google Patents

A new cryogenic diode thermometer

Courts et al., 2002

View PDF
Document ID
9780462426009669402
Author
Courts S
Swinehart P
Yeager C
Publication year
Publication venue
AIP Conference Proceedings

External Links

Snippet

While the introduction of yet another cryogenic diode thermometer is not earth shattering, a new diode thermometer, the DT-600 series, recently introduced by Lake Shore Cryotronics, possesses three features that make it unique among commercial diode thermometers. First …
Continue reading at www.apo.nmsu.edu (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements using resistive elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
    • G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements using change of resonant frequency of a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/60—Protection against electrostatic charges or discharges, e.g. Faraday shields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry
    • G01J5/02—Details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof

Similar Documents

Publication Publication Date Title
Brandt et al. Low temperature thermometry in high magnetic fields. VII. Cernox™ sensors to 32 T
Pope et al. Apparatus for the rapid measurement of electrical transport properties for both “needle-like” and bulk materials
Yeager et al. A review of cryogenic thermometry and common temperature sensors
Rigosi et al. Graphene devices for tabletop and high-current quantized Hall resistance standards
Shaver et al. Thermal and electronic transport properties of p-type ZnSb
Cohen et al. GaAs p‐n Junction Diodes for Wide Range Thermometry
Sample et al. Instrumentation and methods for low temperature measurements in high magnetic fields
Courts et al. Review of Cernox™(Zirconium Oxy‐Nitride) Thin‐Film Resistance Temperature Sensors
Courts et al. A new cryogenic diode thermometer
Mitin et al. Ge-on-GaAs film resistance thermometers for cryogenic applications
Stephenson et al. Temperature measurement
Courts et al. Stability of Cernox™ Resistance Temperature Sensors
Rubin et al. Some practical solutions to measurement problems encountered at low temperatures and high magnetic fields
Khorshev et al. Voltage standard based on dry-cooled high-temperature superconductor Josephson junctions
Dodrill et al. Performance characteristics of silicon diode cryogenic temperature sensors
JP3030337B2 (en) Cryogenic thermometer
Gorbachuk et al. Semiconductor Sensors for a Wide Temperature Range
Courts et al. Cryogenic thermometry—an overview
US4643589A (en) Thermometry employing gallium aluminum arsenide diode sensor
Courts et al. Long-term stability of a cryogenic diode thermometer
Ress et al. Accelerating the Thermal Transient Testing by a Novel Temperature Sensitive Parameter Calibration Method based on IV Characteristic Measurement
Besley et al. Russian germanium resistance thermometers at low temperatures in magnetic fields
JPH07218348A (en) Thin-film thermocouple
Curtis et al. Long term stability and performance of platinum resistance thermometers for use to 1063° C
Courts et al. Effects of room temperature aging on two cryogenic temperature sensor models used in aerospace applications