Nothing Special   »   [go: up one dir, main page]

Lépinay et al., 2015 - Google Patents

Probing the microporosity of low-k organosilica films: MP and t-plot methods applied to ellipsometric porosimetry data

Lépinay et al., 2015

View PDF
Document ID
9302338682788532875
Author
Lépinay M
Broussous L
Licitra C
Bertin F
Rouessac V
Ayral A
Coasne B
Publication year
Publication venue
Microporous and Mesoporous Materials

External Links

Snippet

Ellipsometric porosimetry (EP) experiments are performed to obtain the adsorption isotherms of water, methanol, and toluene on pristine and damaged SiOCH porous materials. The use of gaseous adsorbates with different polarities, sizes, and surface …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/08Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/088Investigating volume, surface area, size or distribution of pores; Porosimetry
    • G01N15/0893Investigating volume, surface area, size or distribution of pores; Porosimetry by measuring weight or volume of sorbed fluid, e.g. B.E.T. method

Similar Documents

Publication Publication Date Title
Ravikovitch et al. Characterization of nanoporous materials from adsorption and desorption isotherms
Baklanov et al. Non-destructive characterisation of porous low-k dielectric films
Lépinay et al. Probing the microporosity of low-k organosilica films: MP and t-plot methods applied to ellipsometric porosimetry data
Maex et al. Low dielectric constant materials for microelectronics
Baklanov et al. Determination of pore size distribution in thin films by ellipsometric porosimetry
Murray et al. Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-k SiO2 xerogel films
Kurig et al. The suitability of infinite slit-shaped pore model to describe the pores in highly porous carbon materials
US20060005608A1 (en) Method for characterizing porous low dielectric constant films
Rasadujjaman et al. A detailed ellipsometric porosimetry and positron annihilation spectroscopy study of porous organosilicate-glass films with various ratios of methyl terminal and ethylene bridging groups
Baklanov et al. Challenges in porosity characterization of thin films: Cross-evaluation of different techniques
Vogt et al. Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry
Borras et al. Critical thickness and nanoporosity of TiO2 optical thin films
Rouessac et al. Three characterization techniques coupled with adsorption for studying the nanoporosity of supported films and membranes
Dutta et al. Pore structure of silica gel: a comparative study through BET and PALS
Halbert et al. Modelling the surface of amorphous dehydroxylated silica: the influence of the potential on the nature and density of defects
Puyrenier et al. Characterization of the impact of plasma treatments and wet cleaning on a porous low k material
Chao et al. Thin films of mesoporous silica: characterization and applications
Silverstein et al. Nanopore formation in a polyphenylene low-k dielectric
Jousseaume et al. Structural study of nanoporous ultra low-k dielectrics using complementary techniques: Ellipsometric porosimetry, X-ray reflectivity and grazing incidence small-angle X-ray scattering
Licitra et al. Multi-solvent ellipsometric porosimetry analysis of plasma-treated porous SiOCH films
Dultsev Investigation of the microporous structure of porous layers using ellipsometric adsorption porometry
Huang et al. Mesoporous silica films—characterization and reduction of their water uptake
Baklanov et al. Characterisation of low-k dielectric films by ellipsometric porosimetry
Hsu et al. Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering
Singh et al. Study of microporosity of active carbon spheres using inverse gas chromatographic and static adsorption techniques