Shi et al., 2021 - Google Patents
Infrared phase measuring deflectometry by using defocused binary fringeShi et al., 2021
View HTML- Document ID
- 8520226481020400966
- Author
- Shi Y
- Chang C
- Liu X
- Gao N
- Meng Z
- Zhang Z
- Publication year
- Publication venue
- Optics Letters
External Links
Snippet
Three-dimensional surface information acquisition of specular objects plays an important role in the fields of automobile industry, aerospace, cultural relic protection, intelligent robotics, equipment manufacturing, and so on. Most of the existing specular surface …
- 238000005259 measurement 0 abstract description 28
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/30—Information retrieval; Database structures therefor; File system structures therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing of optical properties of lenses
- G01M11/0242—Testing of optical properties of lenses by measuring geometrical properties or aberrations
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B3/00—Simple or compound lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Ren et al. | Iterative optimization calibration method for stereo deflectometry | |
| Xiao et al. | Three-dimensional shape measurement of aspheric mirrors with fringe reflection photogrammetry | |
| Stolz et al. | Shape from polarization: a method for solving zenithal angle ambiguity | |
| Shi et al. | Infrared phase measuring deflectometry by using defocused binary fringe | |
| Xu et al. | Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces | |
| Niu et al. | Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry | |
| Li et al. | Reliability-guided phase unwrapping in wavelet-transform profilometry | |
| Liu et al. | 3D shape measurement of diffused/specular surface by combining fringe projection and direct phase measuring deflectometry | |
| Tang et al. | A novel phase measuring deflectometry for aspheric mirror test | |
| Tan et al. | Generic saturation-induced phase error correction for structured light 3D shape measurement | |
| Villalobos-Mendoza et al. | Phase shifting interferometry using a spatial light modulator to measure optical thin films | |
| Guo et al. | Adaptive centroid-finding algorithm for freeform surface measurements | |
| Yao et al. | Three-dimensional shape measurement with an arbitrarily arranged projection moiré system | |
| Xie et al. | Accurate surface profilometry using differential optical sectioning microscopy with structured illumination | |
| Ge et al. | Phase measuring deflectometry based on calibration of the entrance pupil center of the camera lens | |
| Dou et al. | Deep-learning-based deflectometry for freeform surface measurement | |
| Zheng et al. | High dynamic defocus response method for binary defocusing fringe projection profilometry | |
| Niu et al. | Wavefront-coded phase measuring deflectometry for the all-focused measurement | |
| Swain et al. | Telephoto-lens-based Optical Differentiation Wavefront Sensor for freeform metrology | |
| Han et al. | 3D reconstruction of the specular surface using an iterative stereoscopic deflectometry method | |
| Canabal et al. | Improved phase-shifting method for automatic processing of moiré deflectograms | |
| Zhang et al. | Three-dimensional shape measurement of a highly reflected, specular surface with structured light method | |
| Gu et al. | High-accuracy deflectometric microscope system with a large slope range | |
| Li et al. | Picometer-differential twice-exposed element for three-dimensional measurement with extremely long depth of field | |
| Zhao et al. | Reference-free Shack–Hartmann wavefront sensor |