Ershov et al., 2013 - Google Patents
Fourier crystal diffractometry based on refractive opticsErshov et al., 2013
View PDF- Document ID
- 7404119830858611423
- Author
- Ershov P
- Kuznetsov S
- Snigireva I
- Yunkin V
- Goikhman A
- Snigirev A
- Publication year
- Publication venue
- Applied Crystallography
External Links
Snippet
X-ray refractive lenses are proposed as a Fourier transformer for high-resolution X-ray crystal diffraction. By employing refractive lenses the wave transmitted through the object converts into a spatial intensity distribution at its back focal plane according to the Fourier …
- 238000002050 diffraction method 0 title description 7
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Exposure apparatus for microlithography
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Ershov et al. | Fourier crystal diffractometry based on refractive optics | |
Baffou | Quantitative phase microscopy using quadriwave lateral shearing interferometry (QLSI): principle, terminology, algorithm and grating shadow description | |
Braat et al. | Assessment of optical systems by means of point-spread functions | |
Rizzi et al. | X-ray phase contrast imaging and noise evaluation using a single phase grating interferometer | |
Lyubomirskiy et al. | 30-Lens interferometer for high-energy X-rays | |
Kocharyan et al. | X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient | |
Zdora et al. | At-wavelength optics characterisation via X-ray speckle-and grating-based unified modulated pattern analysis | |
Zverev et al. | Coherent X-ray beam expander based on a multilens interferometer | |
Ravi et al. | Generation of sub-wavelength longitudinal magnetic probe using high numerical aperture lens axicon and binary phase plate | |
Freychet et al. | Critical-dimension grazing incidence small angle x-ray scattering | |
Pedersen et al. | Numerical study of Bragg CDI on thick polycrystalline specimens | |
Siavashani et al. | Characterization of transparent thin films by low-coherent diffractometry | |
Gasilov et al. | Refraction and ultra-small-angle scattering of X-rays in a single-crystal diamond compound refractive lens | |
Suvorov et al. | X-ray diffraction imaging of defects in topography (microscopy) studies | |
Ghoorchi-Beygi et al. | Simple digital technique for high-accuracy measurement of focal length based on Fresnel diffraction from a phase wedge | |
Vdovin et al. | Lensless coherent imaging by sampling of the optical field with digital micromirror device | |
Zverev et al. | Beam-shaping elements based on x-ray refractive optics: theory, modeling, and experiment | |
Zápražný et al. | Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications | |
Kohn et al. | Simulations of Bragg diffraction of a focused x-ray beam by a single crystal with an epitaxial layer | |
Trouni et al. | Diffraction image of a point source of slow neutrons in a weakly deformed crystal | |
Merthe et al. | Methodology for optimal in situ alignment and setting of bendable optics for nearly diffraction-limited focusing of soft x-rays | |
Kharitonov et al. | Calculating x-ray diffraction on crystals by means of the differential method | |
CN103559926B (en) | A kind of phase place flap-type nano-focusing unit and method for designing thereof | |
Zhu et al. | Interferometric measurement of phase in EUV masks | |
Balyan et al. | Spherical-wave X-ray dynamical diffraction Talbot effect inside a crystal |