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Semerok et al., 2001 - Google Patents

Microablation of pure metals: laser plasma and crater investigations

Semerok et al., 2001

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Document ID
5920747304660020329
Author
Semerok A
Salle B
Wagner J
Petite G
Gobert O
Meynadier P
Perdrix M
Publication year
Publication venue
Nonresonant Laser-Matter Interaction (NLMI-10)

External Links

Snippet

Crater shapes and plasma plume expansion in the interaction of femtosecond, picosecond and nanosecond laser pulses with various pure metal in air and noble gases at atmospheric pressure were studied. The craters formed at the surfaces were measured by an optical …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B23K26/0626Energy control of the laser beam
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma

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