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Gu et al., 2022 - Google Patents

Determination of damage model parameters using nano-and bulk-scale digital image correlation and the finite element method

Gu et al., 2022

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Document ID
5543592398874141613
Author
Gu G
Kwon J
Moon J
Kwon H
Lee J
Kim Y
Kim E
Seo M
Hwang H
Kim H
Publication year
Publication venue
Journal of Materials Research and Technology

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In this study, the nano-to bulk-scale fracture behaviors of a dual phase (DP) steel were investigated by combining a micro-digital-image-correlation (micro-DIC) technique and the finite element method (FEM). The emergence of surface cracks and nano-to bulk-scale strain …
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