Nothing Special   »   [go: up one dir, main page]

Perez-Prado et al., 2002 - Google Patents

Microstructural evolution in electroplated Cu thin films

Perez-Prado et al., 2002

View PDF
Document ID
5413242620046674867
Author
Perez-Prado M
Vlassak J
Publication year
Publication venue
Scripta Materialia

External Links

Snippet

The microstructural evolution of electroplated Cu films (0.89 to 3.0 μm thick) has been studied by texture analysis. Before annealing, the volume fraction of (111) grains decreases with increasing film thickness, while that of (100),(110), and randomly oriented grains …
Continue reading at projects.iq.harvard.edu (PDF) (other versions)

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • C23C14/16Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
    • C23C14/165Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon by cathodic sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides

Similar Documents

Publication Publication Date Title
Perez-Prado et al. Microstructural evolution in electroplated Cu thin films
Weiss et al. Constrained diffusional creep in UHV-produced copper thin films
Velicu et al. Energy-enhanced deposition of copper thin films by bipolar high power impulse magnetron sputtering
Chou et al. Deposition of TiN thin films on Si (100) by HCD ion plating
Venkatraman et al. Separation of film thickness and grain boundary strengthening effects in Al thin films on Si
Del Valle et al. Separate contributions of texture and grain size on the creep mechanisms in a fine-grained magnesium alloy
Djaziri et al. Are Mo2BC nanocrystalline coatings damage resistant? Insights from comparative tension experiments
Odén et al. The effects of bias voltage and annealing on the microstructure and residual stress of arc-evaporated Cr–N coatings
Mara et al. High-temperature mechanical behavior/microstructure correlation of Cu/Nb nanoscale multilayers
Mukherjee et al. A comparative study of nanocrystalline Cu film deposited using anodic vacuum arc and dc magnetron sputtering
Chen et al. Solute grain boundary segregation during high temperature plastic deformation in a Cr–Mo low alloy steel
Mühlbacher et al. Enhanced Ti0. 84Ta0. 16N diffusion barriers, grown by a hybrid sputtering technique with no substrate heating, between Si (001) wafers and Cu overlayers
Baker et al. Texture transformations in Ag thin films
Sarobol et al. Recrystallization as a nucleation mechanism for whiskers and hillocks on thermally cycled Sn-alloy solder films
Chen et al. Study of mechanical properties of PVD ZrN films, deposited under positive and negative substrate bias conditions
Kreiml et al. Balancing the electro-mechanical and interfacial performance of Mo-based alloy films
Strehle et al. Electrical properties of electroplated Cu (Ag) thin films
Hafner et al. Vapour phase co‐deposition of Al—Cu thin film alloys
Fu et al. Adhesion and interfacial structure of magnetron sputtered TiNi films on Si/SiO2 substrate
Jiang et al. Unraveling dislocation-type evolution dominated strain hardening in laminated Ti/Nb composites
Muppidi et al. Barrier layer, geometry and alloying effects on the microstructure and texture of electroplated copper thin films and damascene lines
Sen et al. Indentation response and structure‐property correlation in a bimodal Ti–6Al–4V alloy
Kim et al. Interplay between grain boundary segregation and electrical resistivity in dilute nanocrystalline Cu alloys
Liao et al. Enhanced growth of the Ni3Sn4 phase at the Sn/Ni interface subjected to strains
Phillips et al. X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films