Perez-Prado et al., 2002 - Google Patents
Microstructural evolution in electroplated Cu thin filmsPerez-Prado et al., 2002
View PDF- Document ID
- 5413242620046674867
- Author
- Perez-Prado M
- Vlassak J
- Publication year
- Publication venue
- Scripta Materialia
External Links
Snippet
The microstructural evolution of electroplated Cu films (0.89 to 3.0 μm thick) has been studied by texture analysis. Before annealing, the volume fraction of (111) grains decreases with increasing film thickness, while that of (100),(110), and randomly oriented grains …
- 239000010409 thin film 0 title description 8
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/16—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
- C23C14/165—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon by cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Perez-Prado et al. | Microstructural evolution in electroplated Cu thin films | |
Venkatraman et al. | Separation of film thickness and grain boundary strengthening effects in Al thin films on Si | |
Mayrhofer et al. | A comparative study on reactive and non-reactive unbalanced magnetron sputter deposition of TiN coatings | |
Weiss et al. | Constrained diffusional creep in UHV-produced copper thin films | |
Chou et al. | Deposition of TiN thin films on Si (100) by HCD ion plating | |
JP6678757B2 (en) | Copper plate material for insulating substrate with copper plate and method of manufacturing the same | |
Djaziri et al. | Are Mo2BC nanocrystalline coatings damage resistant? Insights from comparative tension experiments | |
Mukherjee et al. | A comparative study of nanocrystalline Cu film deposited using anodic vacuum arc and dc magnetron sputtering | |
Mara et al. | High-temperature mechanical behavior/microstructure correlation of Cu/Nb nanoscale multilayers | |
Mühlbacher et al. | Enhanced Ti0. 84Ta0. 16N diffusion barriers, grown by a hybrid sputtering technique with no substrate heating, between Si (001) wafers and Cu overlayers | |
Chen et al. | Solute grain boundary segregation during high temperature plastic deformation in a Cr–Mo low alloy steel | |
Liu et al. | Oxidation behaviour of FeAl intermetallic coatings produced by magnetron sputter deposition | |
Baker et al. | Texture transformations in Ag thin films | |
Wu et al. | Plasma characteristics and properties of Cu films prepared by high power pulsed magnetron sputtering | |
EP1325315A2 (en) | A method for quantifying the texture homogeneity of a polycrystalline material | |
Lee et al. | Recrystallization textures of metals and alloys | |
Sarobol et al. | Recrystallization as a nucleation mechanism for whiskers and hillocks on thermally cycled Sn-alloy solder films | |
Chen et al. | Study of mechanical properties of PVD ZrN films, deposited under positive and negative substrate bias conditions | |
Eiper et al. | Size-independent stresses in Al thin films thermally strained down to− 100° C | |
Rane et al. | Microstructure, electrical resistivity and stresses in sputter deposited W and Mo films and the influence of the interface on bilayer properties | |
Saringer et al. | Restrictions of stress measurements using the curvature method by thermally induced plastic deformation of silicon substrates | |
Strehle et al. | Electrical properties of electroplated Cu (Ag) thin films | |
Sen et al. | Indentation response and structure‐property correlation in a bimodal Ti–6Al–4V alloy | |
Paik et al. | Anisotropy of grain boundary energies as cause of abnormal grain growth in electroplated copper films | |
Jiang et al. | Unraveling dislocation-type evolution dominated strain hardening in laminated Ti/Nb composites |