Nothing Special   »   [go: up one dir, main page]

Cotte et al., 2018 - Google Patents

Applications of synchrotron X-ray nano-probes in the field of cultural heritage

Cotte et al., 2018

View PDF @Full View
Document ID
5087882719937833431
Author
Cotte M
Genty-Vincent A
Janssens K
Susini J
Publication year
Publication venue
Comptes Rendus. Physique

External Links

Snippet

Applications of synchrotron X-ray nano-probes in the field of cultural heritage Page 1 CR Physique 19 (2018) 575–588 Contents lists available at ScienceDirect Comptes Rendus Physique www.sciencedirect.com Physics and arts / Physique et arts Applications of synchrotron …
Continue reading at comptes-rendus.academie-sciences.fr (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N2021/653—Coherent methods [CARS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/102—Different kinds of radiation or particles beta or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes

Similar Documents

Publication Publication Date Title
Cotte et al. Applications of synchrotron X-ray nano-probes in the field of cultural heritage
Tsuji et al. New developments of X-ray fluorescence imaging techniques in laboratory
Bertrand et al. Development and trends in synchrotron studies of ancient and historical materials
Möbus et al. Nanoscale tomography in materials science
Baer et al. Characterization of thin films and coatings
Pouyet et al. Thin-sections of painting fragments: opportunities for combined synchrotron-based micro-spectroscopic techniques
Gonzalez et al. X‐ray Diffraction Mapping for Cultural Heritage Science: a Review of Experimental Configurations and Applications
Somogyi et al. ID22: a multitechnique hard X-ray microprobe beamline at the European Synchrotron Radiation Facility
Ermrich et al. XRD for the analyst
Nowak et al. Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces
Hansford et al. High-resolution X-ray diffraction with no sample preparation
Meixner et al. Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation
Goray et al. Matched characterization of super-multiperiod superlattices
Adams et al. Chemical imaging analysis
Perez et al. Latest developments and opportunities for 3D analysis of biological samples by confocal μ-XRF
Ghirardello et al. Application of Synchrotron Radiation-Based Micro-Analysis on Cadmium Yellows in Pablo Picasso's Femme
Choudhury et al. Application of a spoked channel array to confocal X-ray fluorescence imaging and X-ray absorption spectroscopy of medieval stained glass
Monico et al. Synchrotron radiation Ca K-edge 2D-XANES spectroscopy for studying the stratigraphic distribution of calcium-based consolidants applied in limestones
De Caro et al. Ptychographic imaging of branched colloidal nanocrystals embedded in free-standing thick polystyrene films
Vaxelaire et al. Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach
Eba et al. Combination of projection-based XRF, XAFS and XRD imagings for rapid spatial distribution analysis of a heterogeneous material
Davtyan et al. Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction
Yi et al. Combining depth analysis with surface morphology analysis to analyse the prehistoric painted pottery from Majiayao Culture by confocal 3D-XRF
Sosa et al. Structural and elemental X-ray microanalysis with synchrotron radiation in confocal geometry
Adams et al. X-ray imaging