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Rana et al., 2013 - Google Patents

Improvement of the tracking accuracy of an AFM using MPC

Rana et al., 2013

Document ID
4646815198692603562
Author
Rana M
Pota H
Petersen I
et al.
Publication year
Publication venue
2013 IEEE 8th Conference on Industrial Electronics and Applications (ICIEA)

External Links

Snippet

Tracking a reference signal is one of the major problems of an atomic force microscope (AFM). This article presents the design and experimental implementation of a model predictive control (MPC) scheme, with a vibration compensator for achieving accurate …
Continue reading at ieeexplore.ieee.org (other versions)

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