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Implications of technology scaling on leakage reduction techniques

Published: 02 June 2003 Publication History

Abstract

The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limits and benefits, in terms of the potential leakage reduction, performance penalty, and area and power overhead in 0.25um, 0.18um, and 0.07um technologies. HSPICE simulation results and estimations with various functional units and memory structures are presented to support a comprehensive analysis.

References

[1]
Narendra, S., et al, "Scaling of stack effect and its application for leakage reduction," ISLPED, pp. 195--200, '01.
[2]
Keshavarzi, et al, "Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs," ISLPED, pp 207--212, 2001
[3]
Duarte, D, et al, "Evaluating Run-Time Techniques for Leakage Reduction", ASPDAC, pp. 31--38, 2002
[4]
Ye, Y., Borkar, S., and De, V., "A New Technique for Standby Leakage Reduction in High-Performance Circuits," Sym. on VLSI Circuits, pp. 40--41, 1998
[5]
Halter J., and Najm, F., "A Gate-level Leakage Power Reduction Method for Ultra Low Power CMOS Circuits, IEEE CICC, pp. 475--478, 1997.
[6]
Duarte, D, "Clock Network and Phase-Locked Loop Power Estimation and Experimentation", PhD Thesis, Penn State University, May. 2002

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      cover image ACM Conferences
      DAC '03: Proceedings of the 40th annual Design Automation Conference
      June 2003
      1014 pages
      ISBN:1581136889
      DOI:10.1145/775832
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      New York, NY, United States

      Publication History

      Published: 02 June 2003

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      Author Tags

      1. leakage reduction
      2. low power
      3. technology scaling

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      DAC '03 Paper Acceptance Rate 152 of 628 submissions, 24%;
      Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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      Cited By

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      • (2012)Power-delay Trade-offs in CMOS Circuits Using Self-bias TransistorsIETE Journal of Research10.4103/0377-2063.9407858:1(24)Online publication date: 2012
      • (2010)Design and Analysis of NoCs for Low-Power 2D and 3D SoCsLow Power Networks-on-Chip10.1007/978-1-4419-6911-8_8(199-222)Online publication date: 27-Aug-2010
      • (2009)Leakage in CMOS Nanometric TechnologiesLow-Power CMOS Circuits10.1201/9781420036503.ch3(1-19)Online publication date: 9-Nov-2009
      • (2007)Leakage current optimization techniques during test based on don't care bits assignmentJournal of Computer Science and Technology10.1007/s11390-007-9091-x22:5(673-680)Online publication date: 1-Sep-2007
      • (2006)Dual-Vt Design of FPGAs for Subthreshold Leakage ToleranceProceedings of the 7th International Symposium on Quality Electronic Design10.1109/ISQED.2006.53(735-740)Online publication date: 27-Mar-2006
      • (2004)Spatial computationACM SIGOPS Operating Systems Review10.1145/1037949.102439638:5(14-26)Online publication date: 7-Oct-2004
      • (2004)Spatial computationACM SIGARCH Computer Architecture News10.1145/1037947.102439632:5(14-26)Online publication date: 7-Oct-2004
      • (2004)Spatial computationACM SIGPLAN Notices10.1145/1037187.102439639:11(14-26)Online publication date: 7-Oct-2004
      • (2004)Spatial computationProceedings of the 11th international conference on Architectural support for programming languages and operating systems10.1145/1024393.1024396(14-26)Online publication date: 7-Oct-2004
      • (2004)Exact and heuristic approaches to input vector control for leakage power reductionProceedings of the 2004 IEEE/ACM International conference on Computer-aided design10.1109/ICCAD.2004.1382634(527-532)Online publication date: 7-Nov-2004

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