Article

Free access

Fault diagnosis of bit-slice processor

Authors:

Young Gil Park,

Jung Wan ChoAuthors Info & Claims

ISCA '83: Proceedings of the 10th annual international symposium on Computer architecture

Pages 166 - 172

https://doi.org/10.1145/800046.801652

Published: 13 June 1983 Publication History

PDF eReader

Abstract

This paper proposes a microdiagnostic procedure for efficient fault diagnosis of bit-slice processors that are formed by an array of identical bit-slice processors. A test generation procedure for testing the entire array simultaneously instead of testing single slice, one after another, is presented, which is based on the high functional fault model and restricted multiple slice fault assumption within an array. Fault detection and fault location procedures using the generated test sequence are also presented.

Using these procedures, a test microprogram and diagnostic system for the bit-sliced processor constructed by the array of four Am 2901 bit-slices are developed.

References

[1]

V. P. Srini, 'Fault Diagnosis of Microprocessor System,' IEEE Computer, Jan, 1977, pp.60-65.

Google Scholar

[2]

S. B. Akers, 'Test Generation Technique,' IEEE Computer, March 1980, pp.9-15

Google Scholar

[3]

T. Sridhar and J. P. Hayes, 'Testing Bit-Sliced Microprocessors,' Proc. of 9th Int. Conf. on Fault-Tolerant Computing, 1979, pp.211-218

Google Scholar

[4]

L. C. Chiang, 'Microprocessor Testing-A Module Sensitization Approach,' TRITEK International Company, Nov, 1978

Google Scholar

[5]

S. M. Thatte and J. A. Abraham, 'Test Generation for Microprocessors,' IEEE Tran. on Computers, June 1980, pp.429-441

Digital Library

Google Scholar

[6]

S. M. Thatte and J. A. Abraham, 'A Methodology for Functional Level Testing of Microprocessors,' in Proc. 8th Int. Conf. Fault-Tolerant Computing, 1978, pp.90-95

Google Scholar

[7]

J. P. Hayes and E. J. McCluskey, 'Testability Consideration in Microprocessor-Based Design,' IEEE Computer, March, 1980, pp.17-26

Google Scholar

[8]

M. El-Lithy and R. Husson, 'Bit-Sliced Microprocessor Testing-A Case Study,' in Proc. 10th Int. Conf. Fault-Tolerant Computing, 1980, pp.126-128

Google Scholar

[9]

G. J. Myers, Digital System Design with LSI Bit-Sliced Logic, John Wiley and Sons, 1980

Digital Library

Google Scholar

[10]

Advanced Micro Devices, The Am2900 Family data book, 1978

Google Scholar

[11]

S. M. Thatte and J. A. Abraham, 'Testing of Semiconductor Random Access Memories,' Proc. of 7th Int. Conf. Fault-Tolerant Computing, 1977, pp.81-87

Google Scholar

[12]

C. V. Ramamoorthy and L. C. Chiang, 'System Modelling and Testing Procedure for Microdiagnostics,' IEEE Trans. on Computers, Nov. 1972, pp.1169-1182

Google Scholar

[13]

Y. G. Park, 'Fault Diagnosis of Bit-Sliced Processors,' M.S. Thesis, KAIST, 1982

Google Scholar

Index Terms

Fault diagnosis of bit-slice processor
1. Hardware

Recommendations

Fault diagnosis of bit-slice processor

This paper proposes a microdiagnostic procedure for efficient fault diagnosis of bit-slice processors that are formed by an array of identical bit-slice processors. A test generation procedure for testing the entire array simultaneously instead of ...
An Investigation of Fault Tolerance Behavior of 32-Bit DLX Processor
DEPEND '09: Proceedings of the 2009 Second International Conference on Dependability

This paper presents a study of fault tolerance behavior of a 32-bit DLX processor. Simulation-based method has been applied to analyze the fault tolerance characteristic of this processor. This experiment is based on injection of 14000 faults among 70 ...
A Bit-Slice Microprocessor System for Teaching Microprogramming

This paper describes a microprocessor development system, which was designed for demonstrating the use of bit-slice microprocessors, for teaching microprogramming and for simulating other small microprocessors. The system contains two 2901 bit-slice ...

Comments

Please enable JavaScript to view thecomments powered by Disqus.

Information & Contributors

Information

Published In

ISCA '83: Proceedings of the 10th annual international symposium on Computer architecture

June 1983

424 pages

ISBN:0897911016

DOI:10.1145/800046

ACM SIGARCH Computer Architecture News Volume 11, Issue 3
June 1983
413 pages
ISSN:0163-5964
DOI:10.1145/1067651
Issue’s Table of Contents

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 13 June 1983

Permissions

Request permissions for this article.

Request Permissions

Check for updates

Qualifiers

Article

Acceptance Rates

Overall Acceptance Rate 543 of 3,203 submissions, 17%

Upcoming Conference

ISCA '25

Sponsor:
sigarch

The 52nd Annual International Symposium on Computer Architecture

June 21 - 25, 2025

Tokyo , Japan

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

0
Total Citations
277
Total Downloads

Downloads (Last 12 months)40
Downloads (Last 6 weeks)6

Reflects downloads up to 17 Nov 2024

Other Metrics

View Author Metrics

Citations

View Options

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Index Terms

Recommendations

Fault diagnosis of bit-slice processor

An Investigation of Fault Tolerance Behavior of 32-Bit DLX Processor

A Bit-Slice Microprocessor System for Teaching Microprogramming