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MAGIC: Malicious Aging in Circuits/Cores

Authors:

Naghmeh Karimi,

Arun Karthik Kanuparthi,

Ozgur Sinanoglu,

Ramesh KarriAuthors Info & Claims

ACM Transactions on Architecture and Code Optimization (TACO), Volume 12, Issue 1

Article No.: 5, Pages 1 - 25

https://doi.org/10.1145/2724718

Published: 02 April 2015 Publication History

Abstract

The performance of an IC degrades over its lifetime, ultimately resulting in IC failure. In this article, we present a hardware attack (called MAGIC) to maliciously accelerate NBTI aging effects in cores. In this attack, we identify the input patterns that maliciously age the pipestages of a core. We then craft a program that generates these patterns at the inputs of the targeted pipestage. We demonstrate the MAGIC-based attack on the OpenSPARC processor. Executing this program dramatically accelerates the aging process and degrades the processor’s performance by 10.92% in 1 month, bypassing existing aging mitigation and timing-error correction schemes. We also present two low-cost techniques to thwart the proposed attack.

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Cited By

Karimi N(2025)Security and Device AgingEncyclopedia of Cryptography, Security and Privacy10.1007/978-3-030-71522-9_1643(2276-2279)Online publication date: 8-Jan-2025
https://doi.org/10.1007/978-3-030-71522-9_1643
Mahmod JHicks M(2024)UnTrustZone: Systematic Accelerated Aging to Expose On-chip Secrets2024 IEEE Symposium on Security and Privacy (SP)10.1109/SP54263.2024.00069(4107-4124)Online publication date: 19-May-2024
https://doi.org/10.1109/SP54263.2024.00069
Gonçalves TBeck ALorenzon A(2024)Investigating the Influence of Process Variability on Asymmetric Multicore Processors2024 37th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)10.1109/SBCCI62366.2024.10703977(1-5)Online publication date: 2-Sep-2024
https://doi.org/10.1109/SBCCI62366.2024.10703977
Show More Cited By

Index Terms

MAGIC: Malicious Aging in Circuits/Cores

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Information

Published In

cover image ACM Transactions on Architecture and Code Optimization

ACM Transactions on Architecture and Code Optimization Volume 12, Issue 1

April 2015

201 pages

ISSN:1544-3566

EISSN:1544-3973

DOI:10.1145/2744295

Editor:
Koen De Bosschere
Ghent University

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Copyright © 2015 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Publication History

Published: 02 April 2015

Accepted: 01 January 2015

Revised: 01 January 2015

Received: 01 June 2014

Published in TACO Volume 12, Issue 1

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Center for Interdisciplinary Studies in Security and Privacy (CRISSP) New York, CRISSP-AD
National Science Foundation Computing and Communication Foundation (NSFCCF)

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Cited By

Karimi N(2025)Security and Device AgingEncyclopedia of Cryptography, Security and Privacy10.1007/978-3-030-71522-9_1643(2276-2279)Online publication date: 8-Jan-2025
https://doi.org/10.1007/978-3-030-71522-9_1643
Mahmod JHicks M(2024)UnTrustZone: Systematic Accelerated Aging to Expose On-chip Secrets2024 IEEE Symposium on Security and Privacy (SP)10.1109/SP54263.2024.00069(4107-4124)Online publication date: 19-May-2024
https://doi.org/10.1109/SP54263.2024.00069
Gonçalves TBeck ALorenzon A(2024)Investigating the Influence of Process Variability on Asymmetric Multicore Processors2024 37th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)10.1109/SBCCI62366.2024.10703977(1-5)Online publication date: 2-Sep-2024
https://doi.org/10.1109/SBCCI62366.2024.10703977
Anik MReefat HDanger JGuilley SKarimi NThapliyal HDeMara RPartin-Vaisband IKatkoori S(2023)Aging-Induced Failure Prognosis via Digital SensorsProceedings of the Great Lakes Symposium on VLSI 202310.1145/3583781.3590204(703-708)Online publication date: 5-Jun-2023
https://dl.acm.org/doi/10.1145/3583781.3590204
Xu HZhu RSun XFang XQi PLiang HHuang Z(2022)Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation PredictionJournal of Circuits, Systems and Computers10.1142/S021812662350175X32:10Online publication date: 31-Dec-2022
https://doi.org/10.1142/S021812662350175X
Niknia FDanger JGuilley SKarimi N(2022)Aging Effects on Template Attacks Launched on Dual-Rail Protected ChipsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2021.308880341:5(1276-1289)Online publication date: May-2022
https://doi.org/10.1109/TCAD.2021.3088803
Ebrahimabadi MFadaeinia BMoradi AKarimi N(2022)Does Aging Matter? The Curious Case of Fault Sensitivity Analysis2022 23rd International Symposium on Quality Electronic Design (ISQED)10.1109/ISQED54688.2022.9806232(84-89)Online publication date: 6-Apr-2022
https://doi.org/10.1109/ISQED54688.2022.9806232
Anik MEbrahimabadi MDanger JGuilley SKarimi N(2022)Reducing Aging Impacts in Digital Sensors via Run-Time CalibrationJournal of Electronic Testing10.1007/s10836-021-05976-8Online publication date: 1-Feb-2022
https://doi.org/10.1007/s10836-021-05976-8
Millican SGriffith SXue JYang C(2021)A study of transistor degradation in cyber-physical system control devicesProceedings of the 2021 International Conference on Hardware/Software Codesign and System Synthesis10.1145/3478684.3479251(37-38)Online publication date: 30-Sep-2021
https://dl.acm.org/doi/10.1145/3478684.3479251
Sahoo SKumar ADecky MWong SMerrett GZhao YWang JWang XSingh AXue JYang C(2021)Emergent design challenges for embedded systems and paths forwardProceedings of the 2021 International Conference on Hardware/Software Codesign and System Synthesis10.1145/3478684.3479246(1-10)Online publication date: 30-Sep-2021
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