research-article

Low-cost On-Chip Structures for Combating Die and IC Recycling

Authors:

Mohammad TehranipoorAuthors Info & Claims

DAC '14: Proceedings of the 51st Annual Design Automation Conference

Pages 1 - 6

https://doi.org/10.1145/2593069.2593157

Published: 01 June 2014 Publication History

Abstract

The recycling of electronic components has become a major concern for the industry and government as it potentially impacts the security and reliability of a wide variety of electronic systems. The sheer number of component types (analog, digital, mixed-signal) and sizes (large or small) makes it extremely challenging to find a one-size-fits-all solution to detect and prevent recycled ICs. In this paper, we propose a suite of solutions for combating die and IC recycling (CDIR). These solutions include light-weight, on-chip structures based on ring oscillators (RO-CDIR), anti-fuses (AF-CDIR) and fuses (F-CDIR). Each structure meets the unique needs and limitations of different part types and sizes providing excellent coverage of recycled parts. HSPICE simulation results using 90nm technology demonstrate the effectiveness of our proposed negative-bias temperature instability (NBTI)-aware RO-CDIR for detecting ICs used for very short period of time. Recycling of large digital ICs can effectively be detected by using AF-CDIR. Small analog and digital recycled components can be identified by testing our F-CDIR with very low cost measurement devices, e.g., a multimeter.

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Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Ul Islam Sami MZhou JSaha SRahman FFarahmandi FTehranipoor M(2024)SAP: Silicon Authentication Platform for System-on-Chip Supply Chain Vulnerabilities2024 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)10.1109/ISPASS61541.2024.00020(109-119)Online publication date: 5-May-2024
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Sami MZhang TShuvo AHaque MCalzada PAzar KKamali HRahman FFarahmandi FTehranipoor M(2024)Advancing Trustworthiness in System-in-Package: A Novel Root-of-Trust Hardware Security Module for Heterogeneous IntegrationIEEE Access10.1109/ACCESS.2024.337587412(48081-48107)Online publication date: 2024
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cover image ACM Other conferences

DAC '14: Proceedings of the 51st Annual Design Automation Conference

June 2014

1249 pages

ISBN:9781450327305

DOI:10.1145/2593069

Copyright © 2014 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
SIGBED: ACM Special Interest Group on Embedded Systems
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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Association for Computing Machinery

New York, NY, United States

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Published: 01 June 2014

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DAC '14

DAC '14: The 51st Annual Design Automation Conference 2014

June 1 - 5, 2014

CA, San Francisco, USA

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Ul Islam Sami MZhou JSaha SRahman FFarahmandi FTehranipoor M(2024)SAP: Silicon Authentication Platform for System-on-Chip Supply Chain Vulnerabilities2024 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)10.1109/ISPASS61541.2024.00020(109-119)Online publication date: 5-May-2024
https://doi.org/10.1109/ISPASS61541.2024.00020
Sami MZhang TShuvo AHaque MCalzada PAzar KKamali HRahman FFarahmandi FTehranipoor M(2024)Advancing Trustworthiness in System-in-Package: A Novel Root-of-Trust Hardware Security Module for Heterogeneous IntegrationIEEE Access10.1109/ACCESS.2024.337587412(48081-48107)Online publication date: 2024
https://doi.org/10.1109/ACCESS.2024.3375874
Roy SChen JMaghari NForte D(2024)Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and Secure LDO OdometersJournal of Hardware and Systems Security10.1007/s41635-024-00152-8Online publication date: 18-Jul-2024
https://doi.org/10.1007/s41635-024-00152-8
Calzada PSami MAzar KRahman FFarahmandi FTehranipoor M(2023)Heterogeneous Integration Supply Chain Integrity Through Blockchain and CHSMACM Transactions on Design Automation of Electronic Systems10.1145/362582329:1(1-25)Online publication date: 6-Oct-2023
https://dl.acm.org/doi/10.1145/3625823
Koblah DAcharya RCapecci DDizon-Paradis OTajik SGanji FWoodard DForte D(2023)A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design AutomationACM Transactions on Design Automation of Electronic Systems10.1145/356339128:2(1-57)Online publication date: 6-Mar-2023
https://dl.acm.org/doi/10.1145/3563391
Surabhi VKrishnamurthy PAmrouch HHenkel JKarri RKhorrami F(2023)Golden-Free Robust Age Estimation to Triage Recycled ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323829142:9(2839-2851)Online publication date: Sep-2023
https://doi.org/10.1109/TCAD.2023.3238291
Bryant TChen YKoblah DForte DMaghari N(2023)A Brief Tutorial on Mixed Signal Approaches to Combat Electronic CounterfeitingIEEE Open Journal of Circuits and Systems10.1109/OJCAS.2023.32531444(99-114)Online publication date: 2023
https://doi.org/10.1109/OJCAS.2023.3253144
Sami MKamali HFarahmandi FRahman FTehranipoor M(2023)Enabling Security of Heterogeneous Integration: From Supply Chain to In-Field OperationsIEEE Design & Test10.1109/MDAT.2023.327023440:5(86-95)Online publication date: Oct-2023
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Rahman TBepary MUl Haque MTehranipoor MRahman F(2023)Design and Security-Mitigation of Custom and Configurable Hardware Cryptosystems2023 IEEE 16th Dallas Circuits and Systems Conference (DCAS)10.1109/DCAS57389.2023.10130190(1-6)Online publication date: 14-Apr-2023
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