Article

New test data decompressor for low power applications

Authors:

Grzegorz Mrugalski,

Jerzy TyszerAuthors Info & Claims

DAC '07: Proceedings of the 44th annual Design Automation Conference

Pages 539 - 544

https://doi.org/10.1145/1278480.1278617

Published: 04 June 2007 Publication History

Abstract

The paper presents a novel low power test scheme integrated with the embedded deterministic test environment. It reduces significantly switching rates in scan chains with minimal hardware modification. Experimental results obtained for industrial circuits clearly indicate that switching activity can be reduced up to 150 times along with improved compression ratios.

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Cited By

Tenentes VKavousianos X(2013)High-Quality Statistical Test Compression With Narrow ATE InterfaceIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2013.225639432:9(1369-1382)Online publication date: 1-Sep-2013
https://dl.acm.org/doi/10.1109/TCAD.2013.2256394
Neophytou SMichael M(2012)Test Pattern Generation of Relaxed $n$ -Detect Test SetsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2010.210205620:3(410-423)Online publication date: 1-Mar-2012
https://dl.acm.org/doi/10.1109/TVLSI.2010.2102056
Rajski JCzysz DTyszer J(2012)Low power test application with selective compaction in VLSI designsProceedings of the 2012 IEEE International Test Conference (ITC)10.1109/TEST.2012.6401532(1-10)Online publication date: 5-Nov-2012
https://dl.acm.org/doi/10.1109/TEST.2012.6401532
Show More Cited By

Index Terms

New test data decompressor for low power applications
1. Hardware
  1. Hardware test
  2. Robustness

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Published In

cover image ACM Conferences

DAC '07: Proceedings of the 44th annual Design Automation Conference

June 2007

1016 pages

ISBN:9781595936271

DOI:10.1145/1278480

General Chair:
Steven P. Levitan
Univ. of Pittsburgh, Pittsburgh, PA

Copyright © 2007 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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New York, NY, United States

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Published: 04 June 2007

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DAC07: The 44th Annual Design Automation Conference 2007

June 4 - 8, 2007

California, San Diego

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DAC '07 Paper Acceptance Rate 152 of 659 submissions, 23%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Tenentes VKavousianos X(2013)High-Quality Statistical Test Compression With Narrow ATE InterfaceIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2013.225639432:9(1369-1382)Online publication date: 1-Sep-2013
https://dl.acm.org/doi/10.1109/TCAD.2013.2256394
Neophytou SMichael M(2012)Test Pattern Generation of Relaxed $n$ -Detect Test SetsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2010.210205620:3(410-423)Online publication date: 1-Mar-2012
https://dl.acm.org/doi/10.1109/TVLSI.2010.2102056
Rajski JCzysz DTyszer J(2012)Low power test application with selective compaction in VLSI designsProceedings of the 2012 IEEE International Test Conference (ITC)10.1109/TEST.2012.6401532(1-10)Online publication date: 5-Nov-2012
https://dl.acm.org/doi/10.1109/TEST.2012.6401532
Xijiang Lin (2011)Low power testing - What can commercial DFT tools provide?Proceedings of the 2011 International Green Computing Conference and Workshops10.1109/IGCC.2011.6008609(1-6)Online publication date: 25-Jul-2011
https://dl.acm.org/doi/10.1109/IGCC.2011.6008609
Balatsouka STenentes VKavousianos XChakrabarty KDe Micheli GAl-Hashimi BMueller WMacii E(2010)Defect aware X-filling for low-power scan testingProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871138(873-878)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871138
Wu YChao M(2010)Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test CubesACM Transactions on Design Automation of Electronic Systems10.1145/1870109.187011916:1(1-29)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1145/1870109.1870119
Almukhaizim SMohammad MKhajah MMartino JAraújo GOrailoglu AKlein F(2010)Low-power test in compression-based reconfigurable scan architecturesProceedings of the 23rd symposium on Integrated circuits and system design10.1145/1854153.1854170(55-60)Online publication date: 6-Sep-2010
https://dl.acm.org/doi/10.1145/1854153.1854170
Lin CLin HChen H(2010)On reducing test power and test volume by selective pattern compression schemesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202106118:8(1220-1224)Online publication date: 1-Aug-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2021061
Tenentes VKavousianos X(2010)Self-Freeze Linear Decompressors for Low Power TestingProceedings of the 2010 IEEE Annual Symposium on VLSI10.1109/ISVLSI.2010.37(63-68)Online publication date: 5-Jul-2010
https://dl.acm.org/doi/10.1109/ISVLSI.2010.37
Tzeng CHuang SBenini LDe Micheli GAl-Hashimi BMueller W(2009)QC-fillProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874896(1142-1147)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874896
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