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Automatic generation of parasitic constraints for performance-constrained physical design of analog circuits

Published: 01 November 2006 Publication History

Abstract

A design methodology for the physical design of analog circuits is proposed. The methodology is based on the automatic generation of constraints on parasitics introduced during the layout phase from constraints on the functional performance of the circuit. In this novel performance-constrained approach, the parasitic constraints drive the layout tools to reduce the need for further layout iterations. Parasitic constraint generation involves (1) generation of a set of bounding constraints on the critical parasitics of a circuit to provide maximum flexibility to the layout tools while meeting the performance constraints; and (2) deriving a set of matching constraints on the parasitics from matched-node-pair and matched-branch-pair information in differential circuits. The constraint generator PARCAR is described and results presented for test circuits

Cited By

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  • (2022)Are analytical techniques worthwhile for analog IC placement?Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe10.5555/3539845.3539891(154-159)Online publication date: 14-Mar-2022
  • (2022)Performance-driven Wire Sizing for Analog Integrated CircuitsACM Transactions on Design Automation of Electronic Systems10.1145/355954228:2(1-23)Online publication date: 24-Dec-2022
  • (2021)Fast and Efficient Constraint Evaluation of Analog Layout Using Machine Learning ModelsProceedings of the 26th Asia and South Pacific Design Automation Conference10.1145/3394885.3431547(158-163)Online publication date: 18-Jan-2021
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  1. Automatic generation of parasitic constraints for performance-constrained physical design of analog circuits
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      cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  Volume 12, Issue 2
      November 2006
      177 pages

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      IEEE Press

      Publication History

      Published: 01 November 2006

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      • (2022)Are analytical techniques worthwhile for analog IC placement?Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe10.5555/3539845.3539891(154-159)Online publication date: 14-Mar-2022
      • (2022)Performance-driven Wire Sizing for Analog Integrated CircuitsACM Transactions on Design Automation of Electronic Systems10.1145/355954228:2(1-23)Online publication date: 24-Dec-2022
      • (2021)Fast and Efficient Constraint Evaluation of Analog Layout Using Machine Learning ModelsProceedings of the 26th Asia and South Pacific Design Automation Conference10.1145/3394885.3431547(158-163)Online publication date: 18-Jan-2021
      • (2020)A customized graph neural network model for guiding analog IC placementProceedings of the 39th International Conference on Computer-Aided Design10.1145/3400302.3415624(1-9)Online publication date: 2-Nov-2020
      • (2013)BAGProceedings of the International Conference on Computer-Aided Design10.5555/2561828.2561843(74-81)Online publication date: 18-Nov-2013
      • (2010)Automatic generation of hierarchical placement rules for analog integrated circuitsProceedings of the 19th international symposium on Physical design10.1145/1735023.1735039(47-54)Online publication date: 14-Mar-2010
      • (2009)Analog layout generator for CMOS circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2008.200913728:1(32-45)Online publication date: 1-Jan-2009
      • (2001)Synthesis of analog and mixed-signal integrated electronic circuitsFormal engineering design synthesis10.5555/762002.762016(391-427)Online publication date: 1-Jan-2001
      • (2000)Layout tools for analog ICs and mixed-signal SoCsProceedings of the 2000 international symposium on Physical design10.1145/332357.332378(76-83)Online publication date: 1-May-2000
      • (1998)Constraints space management for the layout of analog IC'sProceedings of the conference on Design, automation and test in Europe10.5555/368058.368552(971-972)Online publication date: 23-Feb-1998
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