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View all- Yu JLei YXie HFu LLiu CRastogi ATufano RBavota GArnaoudova VHaiduc S(2022)Context-based cluster fault localizationProceedings of the 30th IEEE/ACM International Conference on Program Comprehension10.1145/3524610.3527891(482-493)Online publication date: 16-May-2022
- An GYoon JSohn JHong JHwang DYoo SHarman MMiller H(2022)Automatically identifying shared root causes of test breakages in SAP HANAProceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice10.1145/3510457.3513051(65-74)Online publication date: 21-May-2022