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Alleviating the Impact of Coincidental Correctness on the Effectiveness of SFL by Clustering Test Cases

Published: 01 September 2014 Publication History

Abstract

Spectrum-based fault localization techniques leverage coverage information to identify the faulty elements of the program via passed and failed runs. However, the effectiveness of these techniques can be affected adversely by coincidental correctness, which occurs when faulty elements are executed, but the program produces the correct output. This paper proposes a clustering-based strategy to improve the effectiveness of spectrum-based fault localization. The basis of this strategy is that test cases in the same cluster have similar behaviors. Our experimental results show that, the percentage of clusters that contain coincidentally correct test cases in clusters which do not contain failed test cases, is usually smaller than the percentage of coincidentally correct test cases in passed test cases. By clustering test cases and reconstructing the coverage matrix, our extensive experiments demonstrated that the fault-localization accuracy of Spectrum-based fault localization techniques can be effectively improved.

Cited By

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  • (2022)Context-based cluster fault localizationProceedings of the 30th IEEE/ACM International Conference on Program Comprehension10.1145/3524610.3527891(482-493)Online publication date: 16-May-2022
  • (2022)Automatically identifying shared root causes of test breakages in SAP HANAProceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice10.1145/3510457.3513051(65-74)Online publication date: 21-May-2022
  1. Alleviating the Impact of Coincidental Correctness on the Effectiveness of SFL by Clustering Test Cases

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    Published In

    cover image Guide Proceedings
    TASE '14: Proceedings of the 2014 Theoretical Aspects of Software Engineering Conference (tase 2014)
    September 2014
    220 pages
    ISBN:9781479950294

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    IEEE Computer Society

    United States

    Publication History

    Published: 01 September 2014

    Author Tags

    1. Cluster Analysis
    2. Coincidental Correctness
    3. Coverage Matrix Reconstruction
    4. Spectrum-based Fault Localization

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    Cited By

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    • (2022)Context-based cluster fault localizationProceedings of the 30th IEEE/ACM International Conference on Program Comprehension10.1145/3524610.3527891(482-493)Online publication date: 16-May-2022
    • (2022)Automatically identifying shared root causes of test breakages in SAP HANAProceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice10.1145/3510457.3513051(65-74)Online publication date: 21-May-2022

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