To reduce test cost for SOC products, it is important to reduce the cost of testers. When using low-cost testers which have a limited test bandwidth to perform testing, Built-In- Self-Test (BIST) is necessary to reduce the data volume to be transmitted ...
Editor's note:This article, based on a tutorial the author presented at ITC 2008, is an overview and introduction to mixed-signal production test. The article focuses on the fundamental techniques and procedures in production test and explores key ...
Recent advances in design and process technologies of wireless transceivers have enabled RF IC manufactures to reduce die costs thorough higher levels of integration. This often causes an opposite reaction from the packaging and test costs because of ...
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