article

Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools

Authors:

M. Psarakis,

D. Gizopoulos,

A. PaschalisAuthors Info & Claims

Journal of Electronic Testing: Theory and Applications, Volume 13, Issue 3

Pages 315 - 319

https://doi.org/10.1023/A:1008389920806

Published: 01 December 1998 Publication History

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Abstract

Cell Fault Model (CFM) is a well-adopted functional fault model used for cell-based circuits. Despite of the wide adoption of CFM, no test tool is available for the estimation of CFM testability. The vast majority of test tools are based on the single stuck-at fault model.

In this paper we introduce a method to calculate the CFM testability of a cell-based circuit using any single stuck-at fault based test tool. Cells are substituted by equivalent cells and Test Generation and Fault Simulation for CFM are emulated by Test Generation and Fault Simulation for a set of single stuck-at faults of the equivalent cells. The equivalent cell is constructed from the original cell with a simple procedure, with no need of knowledge of gate-level implementation, or its function. With the proposed methodology, the maturity and effectiveness of stuck-at fault based tools is used in testing of digital circuits, with respect to Cell Fault Model, without developing new tools.

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Cited By

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Gizopoulos DPsarakis MPaschalis AZorian Y(2019)Easily Testable Cellular Carry Lookahead AddersJournal of Electronic Testing: Theory and Applications10.1023/A:102374903026819:3(285-298)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1023/A%3A1023749030268
Bareiša EJusas VMotiejūnas KŠeinauskas R(2018)The Realization-Independent Testing Based on the Black Box Fault ModelsInformatica10.5555/1413769.141377116:1(19-36)Online publication date: 17-Dec-2018
https://dl.acm.org/doi/10.5555/1413769.1413771
Yi JHayes J(2018)The coupling model for function and delay faultsJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-3476-y21:6(631-649)Online publication date: 27-Dec-2018
https://dl.acm.org/doi/10.1007/s10836-005-3476-y
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Index Terms

Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools
1. Applied computing
  1. Physical sciences and engineering
    1. Electronics
2. Hardware
  1. Hardware test
  2. Robustness

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Published In

cover image Journal of Electronic Testing: Theory and Applications

Journal of Electronic Testing: Theory and Applications Volume 13, Issue 3

Dec. 1998

98 pages

ISSN:0923-8174

Editor:
Vishwani Agrawal
Bell Labs, Lucent Technologies

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Kluwer Academic Publishers

United States

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Published: 01 December 1998

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Gizopoulos DPsarakis MPaschalis AZorian Y(2019)Easily Testable Cellular Carry Lookahead AddersJournal of Electronic Testing: Theory and Applications10.1023/A:102374903026819:3(285-298)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1023/A%3A1023749030268
Bareiša EJusas VMotiejūnas KŠeinauskas R(2018)The Realization-Independent Testing Based on the Black Box Fault ModelsInformatica10.5555/1413769.141377116:1(19-36)Online publication date: 17-Dec-2018
https://dl.acm.org/doi/10.5555/1413769.1413771
Yi JHayes J(2018)The coupling model for function and delay faultsJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-3476-y21:6(631-649)Online publication date: 27-Dec-2018
https://dl.acm.org/doi/10.1007/s10836-005-3476-y
Gizopoulos DPaschalis AZorian Y(1999)An Effective Built-In Self-Test Scheme for Parallel MultipliersIEEE Transactions on Computers10.1109/12.79522248:9(936-950)Online publication date: 1-Sep-1999
https://dl.acm.org/doi/10.1109/12.795222

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A Practical Approach to Fault Simulation and Test Generation for Bridging Faults

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