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Temperature-dependent crosstalk and frequency spectrum analyses in adjacent interconnects of a mixed CNT bundle

Published: 01 March 2020 Publication History

Abstract

This paper presents temperature-dependent circuit modeling and performance analyses of single as well as capacitively coupled interconnects of a mixed CNT bundle (MCB) with consideration of the tunneling effect at temperatures from 300 to 500 K at the 14-nm technology node. Four possible MCB structures, viz. MCB-1, MCB-2, MCB-3, and MCB-4, are considered, and their results are compared with those for a copper-based interconnect at the same technology node. For the single line architecture, as the temperature is increased from 300 to 500 K, MCB-4 exhibits a shorter propagation delay in comparison with the other MCBs (1–3) and copper. The results of the frequency spectrum analysis reveal that MCB-4 exhibits a 17.70% wider bandwidth than its copper counterpart. Also, the bandwidth of MCB-4 decreases with increasing temperature, indicating greater signal loss at higher temperatures. For the coupled line architecture, considering different switching conditions of the aggressor and victim lines, MCB-4 exhibits a shorter average dynamic crosstalk-induced delay compared with the other MCBs (1–3) or copper. In comparison with the odd mode of switching, MCB-4 exhibits a 36.45% shorter crosstalk-induced delay with the even mode of switching when the temperature is varied from 300 to 500 K. Similarly, the functional crosstalk noise levels in terms of the overshoot, undershoot, rise glitch, and fall glitch are also found to be significantly lower for MCB-4 compared with the other MCBs (1–3) or copper. The results of the simulations further reveal that MCB-4 exhibits frequency noise components with 70.66% lower amplitude compared with copper, which means that MCB-4 filters more noise components than copper. Furthermore, the amplitude of the frequency noise components increases with rise in temperature.

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Cited By

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  • (2021)Performance analysis of MCB-based VLSI interconnects depending on scattering induced by substrate surface roughnessJournal of Computational Electronics10.1007/s10825-020-01593-420:1(709-717)Online publication date: 1-Feb-2021

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          Published In

          cover image Journal of Computational Electronics
          Journal of Computational Electronics  Volume 19, Issue 1
          Mar 2020
          492 pages

          Publisher

          Springer-Verlag

          Berlin, Heidelberg

          Publication History

          Published: 01 March 2020

          Author Tags

          1. Mixed carbon nanotube bundles (MCBs)
          2. Delay
          3. Crosstalk noise voltage
          4. Frequency noise amplitude

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          • (2021)Performance analysis of MCB-based VLSI interconnects depending on scattering induced by substrate surface roughnessJournal of Computational Electronics10.1007/s10825-020-01593-420:1(709-717)Online publication date: 1-Feb-2021

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