Losses in Multilevel Crossover in VLSI Interconnects
Abstract
The radiation and surface wave losses may give rise to electromagnetic interference (EMI) problems in high speed VLSI interconnects. Over and above there will be dielectric and conductor losses. These losses have been evaluated for multilevel interconnects by finite difference time domain (FDTD) technique. The crosstalk between lines in the same level as well as in different levels and propagation delays are also found.
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- Losses in Multilevel Crossover in VLSI Interconnects
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January 2002
753 pages
ISBN:0769514413
Copyright © Copyright (c) 2002 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.
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Published: 07 January 2002
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