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Taking into account asynchronous signals in functional test of complex circuits

Authors:

C. Bellon,

R. VelazcoAuthors Info & Claims

DAC '84: Proceedings of the 21st Design Automation Conference

Pages 490 - 496

Published: 25 June 1984 Publication History

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Abstract

The proposed functional test method for complex circuits presents the following features:

- the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed.

- the circuit behavior is considered as a whole. including the response to instructions (or commands). and to signals at the same level.

Emphasis is put on the signal test: an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.

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Cited By

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Kunda RAbraham JRathi BNarain PSmith R(1991)Speed up of test generation using high-level primitivesProceedings of the 27th ACM/IEEE Design Automation Conference10.1145/123186.123413(594-599)Online publication date: 3-Jan-1991
https://dl.acm.org/doi/10.1145/123186.123413
Bellon CVelazco RZiade H(1988)Analysis of experimental results on functional testing and diagnosis of complex circuitsProceedings of the 1988 international conference on Test: new frontiers in testing10.5555/1896122.1896134(64-72)Online publication date: 12-Sep-1988
https://dl.acm.org/doi/10.5555/1896122.1896134

Index Terms

Taking into account asynchronous signals in functional test of complex circuits
1. Hardware

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Published In

DAC '84: Proceedings of the 21st Design Automation Conference

June 1984

715 pages

ISBN:0818605421

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IEEE Press

Publication History

Published: 25 June 1984

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DAC '84 Paper Acceptance Rate 116 of 290 submissions, 40%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

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Kunda RAbraham JRathi BNarain PSmith R(1991)Speed up of test generation using high-level primitivesProceedings of the 27th ACM/IEEE Design Automation Conference10.1145/123186.123413(594-599)Online publication date: 3-Jan-1991
https://dl.acm.org/doi/10.1145/123186.123413
Bellon CVelazco RZiade H(1988)Analysis of experimental results on functional testing and diagnosis of complex circuitsProceedings of the 1988 international conference on Test: new frontiers in testing10.5555/1896122.1896134(64-72)Online publication date: 12-Sep-1988
https://dl.acm.org/doi/10.5555/1896122.1896134

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Test Methodology for Dual-rail Asynchronous Circuits

Defect-oriented test methodology for complex mixed-signal circuits

Synchronous Test Generation Model for Asynchronous Circuits