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Microarchitectural synthesis of gracefully degradable, dynamically reconfigurable ASICs

Published: 07 October 1996 Publication History

Abstract

In this paper, we propose a novel fault-tolerance scheme, band reconfiguration, to handle multiple permanent faults in functional units of general ASIC designs. An associated high-level synthesis procedure that automatically generates such fault-tolerant systems is also presented. The proposed scheme permits multiple levels of graceful degradation. During each reconfiguration the system instantly reconfigures itself through operation rescheduling and hardware rebinding. The design objectives are optimization of resource utilization rate under each configuration, and reduction of hardware and performance overheads. The proposed high-level synthesis approach enables fast and area-effective implementations of gracefully degradable ASICs.

Cited By

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  • (2010)HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data pathsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871101(723-728)Online publication date: 8-Mar-2010
  • (1998)Efficient Self-Recovering ASIC DesignIEEE Design & Test10.1109/54.73592415:4(25-35)Online publication date: 1-Oct-1998

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        Published In

        cover image Guide Proceedings
        ICCD '96: Proceedings of the 1996 International Conference on Computer Design, VLSI in Computers and Processors
        October 1996
        341 pages
        ISBN:0818675543

        Publisher

        IEEE Computer Society

        United States

        Publication History

        Published: 07 October 1996

        Author Tags

        1. application specific integrated circuits
        2. associated high-level synthesis procedure
        3. band reconfiguration
        4. dynamically reconfigurable ASICs
        5. fault-tolerance scheme
        6. graceful degradation
        7. hardware rebinding
        8. high-level synthesis
        9. microarchitectural synthesis
        10. multiple permanent faults

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        Cited By

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        • (2010)HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data pathsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871101(723-728)Online publication date: 8-Mar-2010
        • (1998)Efficient Self-Recovering ASIC DesignIEEE Design & Test10.1109/54.73592415:4(25-35)Online publication date: 1-Oct-1998

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