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Power-conscious test synthesis and scheduling

Published: 01 July 2003 Publication History

Abstract

BIST increases circuit activity and hence power in data path circuits. The voltage drop that occurs during testing causes some good circuits to fail the testing process, leading to unnecessary manufacturing yield loss. Addressing this problem, the authors show how test synthesis and test scheduling affect power dissipation and present new power-conscious algorithms.

Cited By

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  • (2008)Scan chain clustering for test power reductionProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391680(828-833)Online publication date: 8-Jun-2008
  • (2007)Scan test planning for power reductionProceedings of the 44th annual Design Automation Conference10.1145/1278480.1278614(521-526)Online publication date: 4-Jun-2007
  • (2004)Testability Trade-Offs for BIST Data PathsJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000023680.46155.6520:2(169-179)Online publication date: 1-Apr-2004

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Information & Contributors

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Published In

cover image IEEE Design & Test
IEEE Design & Test  Volume 20, Issue 4
July 2003
78 pages

Publisher

IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 01 July 2003

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Cited By

View all
  • (2008)Scan chain clustering for test power reductionProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391680(828-833)Online publication date: 8-Jun-2008
  • (2007)Scan test planning for power reductionProceedings of the 44th annual Design Automation Conference10.1145/1278480.1278614(521-526)Online publication date: 4-Jun-2007
  • (2004)Testability Trade-Offs for BIST Data PathsJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000023680.46155.6520:2(169-179)Online publication date: 1-Apr-2004

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