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View all- Elm MWunderlich HImhof MZoellin CLeenstra JMaeding NFix L(2008)Scan chain clustering for test power reductionProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391680(828-833)Online publication date: 8-Jun-2008
- Imhof MZoellin CWunderlich HMaeding NLeenstra JLevitan S(2007)Scan test planning for power reductionProceedings of the 44th annual Design Automation Conference10.1145/1278480.1278614(521-526)Online publication date: 4-Jun-2007
- Nicolici NAl-Hashimi B(2004)Testability Trade-Offs for BIST Data PathsJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000023680.46155.6520:2(169-179)Online publication date: 1-Apr-2004