research-article

Efficient soft error vulnerability estimation of complex designs

Authors:

Shahrzad Mirkhani,

Subhasish Mitra,

Chen-Yong Cher,

Jacob AbrahamAuthors Info & Claims

DATE '15: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition

Pages 103 - 108

Published: 09 March 2015 Publication History

Abstract

Analyzing design vulnerability for soft errors has become a challenging process in large systems with a large number of memory elements. Error injection in a complex system with a sufficiently large sample of error candidates for reasonable accuracy takes a large amount of time. In this paper we describe RAVEN, a statistical method to estimate the outcomes of a system in the presence of soft errors injected into flip-flops, as well as the vulnerability for each memory element. This method takes advantage of fast local simulations for each error injection, and calculates the probabilities for the system outcomes for every possible soft error in a period of time. Experimental results, on an out-of-order processor with SPECINT2000 workloads, show that RAVEN is an order of magnitude faster compared with traditional error injection while maintaining accuracy.

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Cited By

Cao XXiao LLi JZhang RLiu SWang J(2019)A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.283442538:6(1109-1122)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1109/TCAD.2018.2834425
Ma JWang Y(2017)Characterization of stack behavior under soft errorsProceedings of the Conference on Design, Automation & Test in Europe10.5555/3130379.3130738(1538-1543)Online publication date: 27-Mar-2017
https://dl.acm.org/doi/10.5555/3130379.3130738
Cheng EMirkhani SSzafaryn LCher CCho HSkadron KStan MLilja KAbraham JBose PMitra S(2016)CLEARProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2897996(1-6)Online publication date: 5-Jun-2016
https://dl.acm.org/doi/10.1145/2897937.2897996

Index Terms

Efficient soft error vulnerability estimation of complex designs

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Information & Contributors

Information

Published In

cover image ACM Conferences

DATE '15: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition

March 2015

1827 pages

ISBN:9783981537048

General Chair:
Wolfgang Nebel
OFFIS & University of Oldenburg, DE
,
Program Chair:
David Atienza
EPFL, CH

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
Russian Acadamy of Sciences: Russian Acadamy of Sciences
IEEE Council on Electronic Design Automation (CEDA)

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EDA Consortium

San Jose, CA, United States

Publication History

Published: 09 March 2015

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Research-article

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DATE '15

Sponsor:

EDAA
EDAC
SIGDA
Russian Acadamy of Sciences

DATE '15: Design, Automation and Test in Europe

March 9 - 13, 2015

Grenoble, France

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DATE '15 Paper Acceptance Rate 206 of 915 submissions, 23%;

Overall Acceptance Rate 518 of 1,794 submissions, 29%

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DATE '25

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Cited By

Cao XXiao LLi JZhang RLiu SWang J(2019)A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.283442538:6(1109-1122)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1109/TCAD.2018.2834425
Ma JWang Y(2017)Characterization of stack behavior under soft errorsProceedings of the Conference on Design, Automation & Test in Europe10.5555/3130379.3130738(1538-1543)Online publication date: 27-Mar-2017
https://dl.acm.org/doi/10.5555/3130379.3130738
Cheng EMirkhani SSzafaryn LCher CCho HSkadron KStan MLilja KAbraham JBose PMitra S(2016)CLEARProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2897996(1-6)Online publication date: 5-Jun-2016
https://dl.acm.org/doi/10.1145/2897937.2897996

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