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Aggregate modeling of semiconductor equipment using effective process times

Published: 11 December 2011 Publication History

Abstract

Performance evaluation using queueing models is common practice in semiconductor manufacturing. Analytical closed-form expressions and simulation models are popular in capacity planning and the analysis of equipment configurations. However, the complexity of semiconductor processes complicates the modeling of the equipment. Analytical models lack the required accuracy, whereas simulation models require too many details, making them impractical. Aggregation is a way to overcome this difficulty. The various details are not modeled in detail, but their contribution is lumped in the aggregate model, which makes the model more appropriate for both analysis and simulation.
This paper gives an overview of our efforts to develop a top-down aggregate modeling approach for semiconductor equipment, starting from the effective process time concept inspired by the Factory Physics book of Hopp and Spearman. The strong feature of our modeling approach is that the aggregate model parameters are estimated directly from industrial data (arrival and departure times), without the need to quantify the various details.

References

[1]
Brooks, R. J., and A. M. Tobias. 2000. "Simplification in the Simulation of Manufacturing Systems". International Journal of Production Research 38 (5): 1009--1027.
[2]
Chandy, K. M., U. Herzog, and L. Woo. 1975. "Parametric Analysis of Queueing networks". IBM Journal of Research and Development 19 (1): 36--42.
[3]
Hopp, W. J., and M. L. Spearman. 1995. Factory Physics: Foundations of Manufacturing Management. 1st ed. New York: IRWIN/McGraw-Hill.
[4]
Hopp, W. J., and M. L. Spearman. 2008. Factory Physics: Foundations of Manufacturing Management. 3rd ed. New York: IRWIN/McGraw-Hill.
[5]
Jacobs, J. H., L. F. P. Etman, E. J. J. van Campen, and J. E. Rooda. 2001. "Quantifying Operational Time Variability: The Missing Parameter for Cycle Time Reduction". In Proceedings of the 2001 Advanced Semiconductor Manufacturing Conference, 1--10. Munich, Germany: SEMI/IEEE.
[6]
Jacobs, J. H., L. F. P. Etman, E. J. J. van Campen, and J. E. Rooda. 2003. "Characterization of Operational Time Variability using Effective ProcessTimes". IEEE Transactions on Semiconductor Manufacturing 16 (3): 511--520.
[7]
Jacobs, J. H., P. P. van Bakel, L. F. P. Etman, and J. E. Rooda. 2006. "Quantifying Variability of Batching Equipment Using Effective Process Times". IEEE Transactions on Semiconductor Manufacturing 19 (2): 269--275.
[8]
Johnson, R. T., J. W. Fowler, and G. T. Mackulak. 2005, December. "A Discrete Event Simulation Model Simplification Technique". In Proceedings of the 2005 Winter Simulation Conference, edited by M. E. Kuhl, N. M. Steiger, F. B. Armstrong, and J. A. Joines, 2172--2176. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
[9]
Kock, A. A. A., L. F. P. Etman, and J. E. Rooda. 2008. "Effective Process Time for Multi-server Flowlines with Finite Buffers". IIE Transactions 40:177--186.
[10]
Kock, A. A. A., L. F. P. Etman, J. E. Rooda, I. J. B. F. Adan, M. van Vuuren, and A. Wierman. 2008. "Aggregate Modeling of Multi-Processing Workstations". Technical Report 2008-032, Eurandom, Eindhoven University of Technology, Eindhoven, The Netherlands. Accessed Oct. 16, 2011. http://www.eurandom.tue.nl/reports.
[11]
Kock, A. A. A., F. J. J. Wullems, L. F. P. Etman, I. J. B. F. Adan, F. Nijsse, and J. E. Rooda. 2008. "Performance Measurement and Lumped Parameter Modeling of Single Server Flow Lines Subject to Blocking: an Effective Process Time Approach". Computers and Industrial Engineering 54:866--878.
[12]
Lefeber, E., and D. Armbruster. 2011. "Aggregate modeling of manufacturing systems". In Planning Production and Inventories in the Extended Enterprise: A State of the Art Handbook, Volume 1, edited by K. G. Kempf, P. Keskinocak, and R. Uzsoy, Volume 151 of Springer International Series in Operations Research and Management Science, Chapter 17, 509--536. New York, NY, USA: Springer-Verlag.
[13]
Morrison, J. R., and D. P. Martin. 2007a. "Performance evaluation of photolithography cluster tools". OR Spectrum 33:375--389.
[14]
Morrison, J. R., and D. P. Martin. 2007b. "Practical extensions to cycle time approximations for the G/G/m-queue with applications". IEEE Transactions on Automation Science and Engineering 4 (4): 523--532.
[15]
E. L. Norton 1926. "Design of finite networks for uniform frequency characteristic". http://www.ece.rice.edu/~dhj/norton/. Accessed Oct. 16, 2011.
[16]
Rose, O. 2000, December. "Why do simple wafer fab models fail in certain scenarios?". In Proceedings of the 2000 Winter Simulation Conference, edited by J. A. Joines, R. R. Barton, K. Kang, and P. A. Fishwick, 1481--1490. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
[17]
Rose, O. 2007, December. "Improved Simple Simulation Models for Semiconductor Wafer Factories". In Proceedings of the 2007 Winter Simulation Conference, edited by S. G. Henderson, B. Biller, M.-H. Hsieh, J. Shortle, J. D. Tew, and R. R. Barton, 1708-1712. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
[18]
Sakasegawa, H. 1977. "An approximation formula lq = αβρ (1 -- ρ)". Annals of the Institute for Statistical Mathematics 29 (1): 67--75.
[19]
van Vuuren, M., and I. Adan. 2009. "Performance analysis of tandem queues with small buffers". IIE Transactions 41 (11): 882--892.
[20]
Veeger, C. P. L., L. F. P. Etman, I. J. B. F. Adan, and J. E. Rooda. 2010, December. "Single-server aggregation of a re-entrant flow line". In Proceedings of the 2010 Winter Simulation Conference, edited by B. Johansson, S. Jain, J. Montoya-Torres, J. Hugan, and E. Yücesan, 2541--2552. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
[21]
Veeger, C. P. L., L. F. P. Etman, E. Lefeber, I. J. B. F. Adan, J. van Herk, and J. E. Rooda. 2011. "Predicting Cycle Time Distributions for Integrated Processing Workstations: An Aggregate Modeling Approach". IEEE Transactions on Semiconductor Manufacturing 24 (2): 223--236.
[22]
Veeger, C. P. L., L. F. P. Etman, J. van Herk, and J. E. Rooda. 2010a. "Generating CT-TH-PM surfaces using EPT-based aggregate modeling". Journal of Simulation 4:242--254.
[23]
Veeger, C. P. L., L. F. P. Etman, J. van Herk, and J. E. Rooda. 2010b. "Generating Cycle Time-Throughput Curves using Effective Process Time based Aggregate Modeling". IEEE Transactions on Semiconductor Manufacturing 23 (4): 517--526.
[24]
Whitt, W. 1993. "Approximating the GI/G/m queue". Production and Operations Management 2 (2): 114--161.
[25]
Wu, K., and K. Hui. 2008. "The Determination and Indertermination of Service Times in Manufacturing Systems". IEEE Transactions on Semiconductor Manufacturing 21 (1): 72--82.

Cited By

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  • (2016)A literature review on variability in semiconductor manufacturingProceedings of the 2016 Winter Simulation Conference10.5555/3042094.3042419(2598-2609)Online publication date: 11-Dec-2016
  • (2014)Big data in daily manufacturing operationsProceedings of the 2014 Winter Simulation Conference10.5555/2693848.2694145(2364-2375)Online publication date: 7-Dec-2014
  • (2012)Aggregate simulation modeling of an MRI department using effective process timesProceedings of the Winter Simulation Conference10.5555/2429759.2429867(1-12)Online publication date: 9-Dec-2012

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    WSC '11: Proceedings of the Winter Simulation Conference
    December 2011
    4336 pages

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    Published: 11 December 2011

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    December 11 - 14, 2011
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    WSC '11 Paper Acceptance Rate 203 of 270 submissions, 75%;
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    View all
    • (2016)A literature review on variability in semiconductor manufacturingProceedings of the 2016 Winter Simulation Conference10.5555/3042094.3042419(2598-2609)Online publication date: 11-Dec-2016
    • (2014)Big data in daily manufacturing operationsProceedings of the 2014 Winter Simulation Conference10.5555/2693848.2694145(2364-2375)Online publication date: 7-Dec-2014
    • (2012)Aggregate simulation modeling of an MRI department using effective process timesProceedings of the Winter Simulation Conference10.5555/2429759.2429867(1-12)Online publication date: 9-Dec-2012

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